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References
W FE Emitter
A. V. Crewe, D. N. Eggenberger, J. Wall, and L. M. Welter, “Electron gun using a field-emission source”, Rev. Sci. Instrum. 39 (4), pp. 576–583 (1968).
A. V. Crewe, J. Wall, and L. M. Welter, “A high-resolution scanning transmission electron microscope”, J. Appl. Phys. 39 (12), pp. 5861–5868 (1968).
A. V. Crewe, M. Isaacson, and D. Johnson, “A simple scanning electron microscope”, Rev. Sci. Instrum. 40 (2), pp. 241–246 (1969).
S. Tamaki, T. Inoue, E. Sugata, and H. W. Kim, “Remolding of <310>-tungsten tip in field-ion microscope”, Japan. J. Appl. Phys.15 (2), pp. 265–272 (1976).
S. Yamamoto, S. Fukuhara, H. Okano, and N. Saito, “Field emission current instability in the “ever-decreasing” region, Japan. J. Appl. Phys.. 15 (9), pp. 1643–1646 (1976).
D. J. Swann and K. C. A. Smith, “Lifetime and noise characteristics of tungsten field emitters”, Scanning Electron Microscopy/1973/I, pp. 42–48.
H. Todokoro, N. Saitou, and S. Yamamoto, “Role of ion bombardment in field emission current instability”, Japan. J. Appl. Phys.. 21 (10), pp. 1513–1516 (1982).
L. H. Veneklasen and B. M. Siegel, “Oxygen-processed field emission source”, J. Appl. Phys. 43 (4), pp. 1600–1604 (1972).
N. Tamura, “Basic study of TF emission”, Scanning Electron Microscopy/1979/I, pp. 31–38.
W. P. Dyke, J. K. Trolan, E. E. Martin, and J. P. Barbour, “The field emission initiated vacuum arc. I. Experiments on arc initiation”, Phys. Rev. 91 (5), pp. 1043–1054 (1953).
W. W. Dolan, W. P. Dyke, and J. K. Trolan, “The field emission initiated vacuum arc. II. The resistively heated emitter”, Phys. Rev. 91 (5), pp. 1054–1057 (1953).
W. P. Dyke, J. K. Trolan, W. W. Dolan, and G. Barnes, “The field emitter: fabrication, electron microscopy, and electric field calculations”, J. Appl. Phys. 24 (5), pp. 570–576 (1953).
W. P. Dyke, F. M. Charbonnier, R. W. Strayer, R. L. Floyd, J. P. Barbour, and J. K. Trolan, “Electrical stability and life of the heated field emission cathode”, J. Appl. Phys. 31 (5), pp. 790–805 (1960).
S. Nakamura and T. Kuroda, “Remolding of field emission cathode”, Oyo Buturi(Journal of the Japan Society of Applied Physics) 42 (10), pp. 975–982 (1973) (in Japanese).
F. A. Nichols and W. W. Mullins, “Morphological changes of a surface of revolution due to capillarity-induced surface diffusion”, J. Appl. Phys. 36 (6), pp. 1826–1835 (1965).
E. Sugata and D. Mun, “Morphological changes by heating of tungsten cathode for field emission microscope”, Oyo Buturi (Journal of the Japan Society of Applied Physics) 38 (11), pp. 1024–1031 (1969) (in Japanese).
M. Pichaud, A. Müller, and M. Drechsler, “Temperature distribution along metal tips (for field emission microscopy and the study of surface phenomena)”, Surface Science 26, pp. 14–20 (1971).
H. Morikawa, K. Matsusaka, H. Kurata, Y. Yoshino, “The build-up process of (111) pole of a tungsten tip and the shape change of a tip cap”, Shinku J. Vac. Soc. Japan 44 (1), pp. 36–41 (2001) (in Japanese).
H. Morikawa and K. Goto, “Reproducible sharp-pointed tip preparation for field ion microscopy by controlled ac polishing”, Rev. Sci. Instrum. 59 (10), pp. 2195–2197 (1988).
A. J. Emons and K. L. Hagemans, “Use of a field-electron emitter as a pressure indicator in ultrahigh vacuum”, J. Vac. Sci. Technol. 9 (1), pp. 112–116 (1972).
L. de Chernatony and J. Yarwood, “Problems in the production and measurement of very high vacuum, especially in applications, and a new approach to measurement based on the use of field emission”, Vacuum 29 (3), pp. 125–128 (1979).
L. de Chernatony, “Problems in the production and measurement of atomically clean surface environments and their confirmation based on the use of field emission”, Vacuum 29 (11/12), pp. 389–403 (1979).
S. Yamamoto, K. Susa, and U. Kawabe, “Work functions of binary compounds”, J. Chem. Phys. 60 (10), pp. 4076–4080 (1974).
Y. Yamamoto and T. Miyokawa, ”Emission characteristics of a conical field emission gun”, J. Vac. Sci. Technol. B 16 (5), pp. 2871–2875 (1998).
J. F. Hainfeld, “Understanding and using field emission sources”, Scanning Electron Microscopy/1977/I, pp. 591–604.
ZrO/W Emitter
L. W. Swanson and N. A. Martin, “Field electron cathode stability studies: Zirconium/tungsten thermal-field cathode”, J. Appl. Phys. 46 (5), pp. 2029–2050 (1975).
L. W. Swanson, “Comparative study of the zirconiated and built-up W thermal-field cathode”, J. Vac. Sci. Technol. 12 (6), pp. 1228–1233 (1975).
J. E. Wolfe, “Operational experience with zirconiated T-F emitters”, J. Vac. Sci. Technol. 16 (6), pp. 1704–1708 (1979).
L. R. Danielson, “The Zr-O-W <100>emitter and coadsorption of zirconium and carbon monoxide on W <100>”, J. Appl. Phys. 52 (11), pp. 6769–6776 (1981).
N. K. Kang, D. Tuggle, and L. W. Swanson, “A numerical analysis of the electric field and trajectories with and without the effect of space charge for a field electron source”, Optik 63 (4), pp. 313–331 (1983).
R. Speidel, P. Brauchle, B. Kramer und U. Schwab, “Die Zr-O-W-Feldemissionskathode im Niedertemperaturbetrieb”, Optik 71 (4), pp. 167–172 (1985).
H. S. Kim, E. Kratschmer, M. L. Yu, M. G. R. Thomson, and T. H. P. Chang, “Evaluation of Zr/O/W Schottky emitters for microcolumn applications”, J. Vac. Sci. Technol. B 12 (6), pp. 3413–3417 (1994).
H. S. Kim, M. L. Yu, M. G. R. Thomson, E. Kratschmer, and T. H. P. Chang, “Performance of Zr/O/W Schottky emitters at reduced temperatures”, J. Vac. Sci. Technol. B 15 (6), pp. 2284–2288 (1997).
LaB6 Emitter
J. M. Lafferty, “Boride cathodes”, J. Appl. Phys. 22 (3), pp. 299–309 (1951).
S. Nakagawa and T. Yanaka, “A highly stable electron probe obtained with LaB6 cathode electron gun”, Scanning Electron Microscopy/1975/I, pp. 20–26.
C. K. Crawford, “Mounting methods and operating characteristics for LaB6 cathodes”, Scanning Electron Microscopy/1979/I, pp. 19–30.
P. B. Sewell, “High brightness thermionic electron guns for electron microscopes”, Scanning Electron Microscopy/1980/I, pp. 11–24.
M. Futamoto, M. Nakazawa, K. Usami, S. Hosoki, and U. Kawabe, “Thermionic emission properties of a single-crystal LaB6 cathode”, J. Appl. Phys. 51 (7), pp. 3869–3876 (1980).
F. J. Hohn, “Development and use of high brightness lanthanum hexaboride electron guns”, Scanning Electron Microscopy/1985/IV, pp. 1327–1338.
Other FE Emitters
I. Ishizawa, S. Aoki, C. Oshima, and S. Otani, “Field emission properties of surface-processed TiC <110>field emitter”, Shinku J. Vac. Soc. Japan 29 (12), pp. 578–584 (1986) (in Japanese).
Y. Ishizawa, S. Aoki, C. Oshima, and S. Otani, “Design and operation of extremely high vacuum field emission gun”, Shinku (J. Vac. Soc. Japan) 29 (11), pp. 544–548 (1986) (in Japanese).
Y. Endo, I. Honjo, and A. Ito, “Application of micro field emitters to a miniature electron beam column”, Shinku (J. Vac. Soc. Japan) 43 (2), pp. 112–118 (2000) (in Japanese).
H. Adachi, “Approach to a stable field emission electron source”, Scanning Electron Microscopy/1985/II, pp. 473–487.
T. Ichinokawa and Y. Kamiya, “Electron source”, Electron Microscopy 19 (2), pp. 71–76 (1984) (in Japanese).
H. Seiler, “Secondary electron emission in the scanning electron microscope”, J. Appl. Phys. 54 (11), pp. R2–R18 (1983).
Other Articles
J. B. McGinn, L. W. Swanson, N. A. Martin, M. A. Gesley, M. A. McCord, R. Viswanathan, F. J. Hohn, A. D. Wilson, R. Naumann, and M. Utlaut, “100 kV Schottky electron gun”, J. Vac. Sci. Technol. B96), pp. 2925–2928 (1991).
R. Shimizu, T. Shinike, T. Tanaka, C. Oshima, S. Kawai, H. Hiraoka, and H. Hagiwara, “Brightness of single crystal LaB6 cathodes of <100>and <110>orientations”, Scanning Electron Microscopy/1979/I, pp. 11–18.
M. Futamoto, M. Nakazawa, K. Usami, S. Hosoki, and U. Kawabe, “Thermionic emission properties of a single-crystal LaB6 cathode”, J. Appl. Phys. 51 (7), pp. 3869–3876 (1980).
M. Yamabe, Y. Furukawa, and T. Inagaki, “Electron emission from <100>LaB6 cathodes with large cone angles and flat tips”, J. Vac. Sci. Technol. A 2 (3), pp. 1361–1364 (1984).
H. Adachi, “Approach to a stable field emission electron source”, Shinku (J. Vac. Soc. Japan) 29 (1), pp. 13–25 (1986) (in Japanese).
Other
W. I. Karain, L. V. Knight, D. D. Allred, and A. Reyes-Mena, “Emitted current instability from silicon field emission emitters due to sputtering by residual gas ions”, J. Vac. Sci. Technol. A 12 (4), pp. 2581–2585 (1994).
S. Albin, W. Fu, A. Varghese, A. C. Lavarias, and G. R. Myneni, “Diamond coated silicon field emitter array”, J. Vac. Sci. Technol. A 17 (4), pp. 2104–2108 (1999).
D. Chen, W. Y. Cheung, S. P. Wong, Y. M. Fung, J. B. Xu, I. H. Wilson, and R. W. M. Kwok, “Field emission characteristics of SiC capped Si tip array by ion beam synthesis”, J. Vac. Sci. Technol. A 17 (4), pp. 2109–2112 (1999).
D. Temple, W. D. Palmer, L. N. Yadon, J. E. Mancusi, D. Vellenga, and G. E. McGuire, “Silicon field emitter cathodes: Fabrication, performance, and applications”, J. Vac. Sci. Technol. A 16 (3), pp. 1980–1990 (1998).
C. Lea, “Field emission from carbon fibres”, J. Phys. D: Appl. Phys, 6, pp. 1105–1114 (1973).
N. de Jonge, Y. Lamy, K. Schoots, and T. H. Oosterkamp, “High brightness electron beam from a multi-walled carbon nanotube”, Nature 420, pp. 393–395 (2002).
C. A. Spindt, I. Brodie, L. Humphrey, and E. R. Westerberg, “Physical properties of thin-film field emission cathodes with molybdenum cones”, J. Appl. Phys. 47 (12), pp. 5248–5263 (1976).
J. Itoh and H. Hiroshima, “Fabrication and theoretical study of micro-size vertical vacuum triodes”, 2nd Int. Conf. on Vac. Microelectron., Bath, 1989, pp. 231–234 (Inst. Phys. Conf. Ser. No 99: Section 7).
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Yoshimura, N. (2008). Emitters for Fine Electron Probes. In: Vacuum Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-74433-7_8
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