Abstract
Static secondary ion mass spectrometry provides information on the molecular composition of the topmost layer of a sample. It is mostly used as a complementary technique to determine surface composition, surface contamination or surface segregation of components. The time-of-flight technique enables high mass resolution also at the higher mass values needed for polymers.
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Pleul, D., Simon, F. (2008). Time-of-Flight Secondary Ion Mass Spectrometry. In: Stamm, M. (eds) Polymer Surfaces and Interfaces. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-73865-7_5
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DOI: https://doi.org/10.1007/978-3-540-73865-7_5
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