Abstract
Reliable operation of semiconductor detectors requires insensitivity to environmental conditions such as humidity, temperature and working in atmospheric or vacuum conditions. The radiation to be measured may change the detector material and thus also the properties of the detector.
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© 2007 Springer-Verlag Berlin Heidelberg
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Lutz, G. (2007). Device Stability and Radiation Hardness. In: Semiconductor Radiation Detectors. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-71679-2_11
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DOI: https://doi.org/10.1007/978-3-540-71679-2_11
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-71678-5
Online ISBN: 978-3-540-71679-2
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