Ultrasimple extremely broadband transient-grating frequency-resolved-optical-gating device

Lee, Dongjoo; Akturk, Selcuk; Gabolde, Pablo; Trebino, Rick

doi:10.1007/978-3-540-68781-8_69

Dongjoo Lee⁸,
Selcuk Akturk⁸,
Pablo Gabolde⁸ &
…
Rick Trebino⁸

Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 88))

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Abstract

We demonstrate an ultrasimple, extremely broad band, alignment-free, and single-shot Transient-Grating Frequency-Resolved-Optical-Gating device using a mask that separates the input beam into three beams and a Fresnel biprism that crosses and delays them. Unlike previous ultrasimple ultrashort-pulse-measurement devices (i.e., GRENOUILLE), this device is also ambiguity-free and extremely broadband—it can measure UV, visible, and IR (amplified) pulses without change of optics.

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References

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Authors and Affiliations

School of Physic, Georgia Institute of Technology, Atlanta, Georgia, 300332-0430
Dongjoo Lee, Selcuk Akturk, Pablo Gabolde & Rick Trebino

Authors

Dongjoo Lee
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Selcuk Akturk
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Pablo Gabolde
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Rick Trebino
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Editors and Affiliations

Steacie Institute for Molecular Sciences, National Research Council Canada, 100 Sussex Drive, Rm 2063, Ottawa, ON, K1A 0R6, Canada
Paul Corkum
Department of Chemistry & Biochemistry 215 UCB, University of Colorado, Boulder, Boulder, CO, 80309-0215, USA
David M. Jonas
Department of Chemistry, University of Toronto, 80 St. George Street, Toronto, ON, M5S 3H6, Canada
R. J. Dwayne. Miller
School of Electrical & Computer Engineering, Purdue University, 1285 Elec. Eng. Bldg., West Lafayette, IN, 47907-1285, USA
Andrew M. Weiner

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Lee, D., Akturk, S., Gabolde, P., Trebino, R. (2007). Ultrasimple extremely broadband transient-grating frequency-resolved-optical-gating device. In: Corkum, P., Jonas, D.M., Miller, R.J.D., Weiner, A.M. (eds) Ultrafast Phenomena XV. Springer Series in Chemical Physics, vol 88. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-68781-8_69

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DOI: https://doi.org/10.1007/978-3-540-68781-8_69
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-68779-5
Online ISBN: 978-3-540-68781-8
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