Characteristic features of ferroelectric materials are the transition in crystal structure from a cubic paraelectric phase to a lower-symmetry ferroelectric phase at the Curie temperature T c and the possibility of changing the polarization of polycrystalline materials by means of electric fields. Both features give rise to challenges with respect to X-ray analysis and microscopy.
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Hoffmann, M.J., Kungl, H., Theissmann, R., Wagner, S. (2008). Microstructural Analysis Based on Microscopy and X-Ray Diffraction. In: Piezoelectricity. Springer Series in Materials Science, vol 114. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-68683-5_17
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