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Optical Beam Deflection in Semiconductors with Electron Beam Excitation

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Photoacoustic and Photothermal Phenomena II

Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 62))

Abstract

Optical beam deflection experiments performed in a scanning electron microscope are used to investigate electron-beam-specimen interactions and thermal and electronic diffusion in semiconductors.

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References

  1. J.C. Murphy, J.W. Maclachlan and L.C. Aamodt, IEEE Trans. Ultrason., Ferroelec., and Freq. Contr. UFFC-33, 529 (1986).

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  4. J.W. Maclachlan, J.C. Murphy and L.C. Aamodt, Bull. Am. Phys. Soc. 33, 301 (1988).

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© 1990 Springer-Verlag Berlin Heidelberg

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Murphy, J.C., Spicer, J.W.M., Givens, R.B., Aamodt, L.C., Chang, G. (1990). Optical Beam Deflection in Semiconductors with Electron Beam Excitation. In: Murphy, J.C., Spicer, J.W.M., Aamodt, L.C., Royce, B.S.H. (eds) Photoacoustic and Photothermal Phenomena II. Springer Series in Optical Sciences, vol 62. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-46972-8_62

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  • DOI: https://doi.org/10.1007/978-3-540-46972-8_62

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-13795-6

  • Online ISBN: 978-3-540-46972-8

  • eBook Packages: Springer Book Archive

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