Abstract
Optical beam deflection experiments performed in a scanning electron microscope are used to investigate electron-beam-specimen interactions and thermal and electronic diffusion in semiconductors.
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Murphy, J.C., Spicer, J.W.M., Givens, R.B., Aamodt, L.C., Chang, G. (1990). Optical Beam Deflection in Semiconductors with Electron Beam Excitation. In: Murphy, J.C., Spicer, J.W.M., Aamodt, L.C., Royce, B.S.H. (eds) Photoacoustic and Photothermal Phenomena II. Springer Series in Optical Sciences, vol 62. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-46972-8_62
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DOI: https://doi.org/10.1007/978-3-540-46972-8_62
Publisher Name: Springer, Berlin, Heidelberg
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