Abstract
A repetitive laser plasma x-ray source for various applications has been developed using a zigzag glass slab laser and rotating target. For x-ray microscopy applications, we characterize intense line emissions from laser produced carbon ions with a grazing incidence spectrometer.
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© 1992 Springer-Verlag Berlin Heidelberg
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Daido, H., Zeng, G.M., Togawa, T., Aritome, H., Nakatsuka, M., Nakai, S. (1992). Repetitive Laser-Plasma X-Ray Source for Microscopy Applications. In: Michette, A.G., Morrison, G.R., Buckley, C.J. (eds) X-Ray Microscopy III. Springer Series in Optical Sciences, vol 67. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-46887-5_7
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DOI: https://doi.org/10.1007/978-3-540-46887-5_7
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-662-13894-6
Online ISBN: 978-3-540-46887-5
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