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X-Ray Microscopy III pp 160–163Cite as

The NPL X-Ray Reflection Scanning Microscope

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Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 67))

Abstract

A compact reflection scanning x-ray microscope has been constructed having as its principal components a microfocus x-ray source, a grazing incidence reflector, a scanning specimen stage, a gas flow proportional counter, and the electronics for image display and instrument control. The instrument is currently being commissioned.

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Reference

  1. A Franks and B Gale, Grazing Incidence Optics for X-ray Microscopy in: X-Ray Microscopy, eds. G Schmall and D Rudolph, Springer Series in Optical Sciences, Vol 43, ( Springer Berlin, Heidelberg 1984 ), p. 129–138.

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Author notes

  1. T. H. English

    Present address: Roxeath Consultancy, UK

Authors and Affiliations

  1. Division of Mechanical and Optical Metrology, National Physical Laboratory, Teddington, Middlesex, TW11 0LW, UK

    J. Anderson, A. Franks, K. Jackson, K. Lindsey, C. J. Robbie, S. J. C. Speed & M. Stedman

Authors
  1. J. Anderson
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  2. T. H. English
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  3. A. Franks
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  4. K. Jackson
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  5. K. Lindsey
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  6. C. J. Robbie
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  7. S. J. C. Speed
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  8. M. Stedman
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Editor information

Editors and Affiliations

  1. Physics Department, King’s College London, The Strand, WC2R 2LS, London, UK

    Alan G. Michette Ph. D. , Graeme R. Morrison Ph. D.  & Chistopher J. Buckley Ph. D. ,  & 

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© 1992 Springer-Verlag Berlin Heidelberg

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Cite this paper

Anderson, J. et al. (1992). The NPL X-Ray Reflection Scanning Microscope. In: Michette, A.G., Morrison, G.R., Buckley, C.J. (eds) X-Ray Microscopy III. Springer Series in Optical Sciences, vol 67. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-46887-5_37

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  • DOI: https://doi.org/10.1007/978-3-540-46887-5_37

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-13894-6

  • Online ISBN: 978-3-540-46887-5

  • eBook Packages: Springer Book Archive

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