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Status of a Laboratory X-Ray Microscope

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X-Ray Microscopy II

Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 56))

Abstract

X-ray microscopy experiments using x-ray optical systems are performed with synchrotron radiation of electron storage rings. The highest resolution obtained up to now in such experiments is about 50 nm. The exposure time to take pictures with this resolution is a few seconds. X-ray optical elements are under development which allow to improve the resolution to about 10 nm. For such high resolution experiments synchrotron radiation sources will not be replaced by other devices in the foreseeable future.

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References

  1. G. Herziger: “X-Ray Emission from a lkJ Plasma Focus” in: X-Ray Microscopy eds. G. Schmahl and D. Rudolph, Springer Series in Optical Sciences. 43, ( Springer, Berlin, Heidelberg 1984 ), p. 19–24

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  2. W. Neff, J. Eberle, R. Holz, F. Richter and R. Lebert: “A Plasma Focus as Radiation Source for a Laboratory X-Ray Microscope”, this volume

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  3. B. Niemann, D. Rudolph and G. Schmahl: “Soft X-Ray Imaging Zone Plates with Large Zone Numbers for Microscopic and Spectroscopic Applications”, Optics Communications, 12, Nr. 2, p. 160–163, (1974)

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  4. D. Rudolph. B. Niemann, G. Schmahl and 0. Christ: “The Göttingen X-Ray Microscope and X-Ray Microscopy Experiments at the BESSY Storage Ring”, see ref. 1, p. 192–202

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  5. W. Meyer-Ilse: “Application of Charge Coupled Detectors in X-Ray Microscopy”, this volume

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  6. J. Thieme: “Theoretical Investigations of Imaging Properties of Zone Plates using Diffraction Theory”, this volume

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Author information

Authors and Affiliations

  1. Forschungsgruppe Röntgenmikroskopie, Universität Göttingen, Geiststraße 11, D-3400, Göttingen, Fed. Rep. of Germany

    D. Rudolph, B. Niemann, G. Schmahl & J. Thieme

Authors
  1. D. Rudolph
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  2. B. Niemann
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  3. G. Schmahl
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  4. J. Thieme
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Editor information

Editors and Affiliations

  1. IBM T.J. Watson Research Center, 10598, Yorktown Heights, NY, USA

    David Sayre Ph. D.

  2. Department of Physics, State University of New York, 11794, Stony Brook, NY, USA

    Janos Kirz Ph. D.

  3. Center for X-Ray Optics, Lawrence Berkeley Laboratory, University of California at Berkeley, 1 Cyclotron Rd., 94720, Berkeley, CA, USA

    Malcolm Howells Ph. D.

  4. National Synchrotron Light Source, Brookhaven National Laboratory, 11973, Upton, NY, USA

    Harvey Rarback Ph. D.

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© 1988 Springer-Verlag Berlin Heidelberg

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Rudolph, D., Niemann, B., Schmahl, G., Thieme, J. (1988). Status of a Laboratory X-Ray Microscope. In: Sayre, D., Kirz, J., Howells, M., Rarback, H. (eds) X-Ray Microscopy II. Springer Series in Optical Sciences, vol 56. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-39246-0_38

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  • DOI: https://doi.org/10.1007/978-3-540-39246-0_38

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-14490-9

  • Online ISBN: 978-3-540-39246-0

  • eBook Packages: Springer Book Archive

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