Skip to main content
SpringerLink
Log in

The Detection of Soft X-Rays with Charged Coupled Detectors

  • Conference paper
X-Ray Microscopy

Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 43))

Abstract

The characteristics of an ideal soft x-ray imaging detector are enumerated. Of recent technical developments the CCD or charge coupled device goes furthest to meeting these requirements. Several properties of CCDs are described with reference to experimental work and their application to practical instruments is reviewed.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Log in via an institution
Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 39.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. P. Gorenstein, H. Gursky, F.R. Harnden, Jr., A. DeCaprio, and P. Bjorkohlm: IEEE Trans. NS-22, 616 (1975)

    Google Scholar 

  2. R. Giacconi et al.: Astrophys. J. 230, 540 (1979)

    Article  ADS  Google Scholar 

  3. J.M. Davis, J.W. Ting, and M. Gerassimenko: Space Sci. Instrum. 5, 17 (1979)

    Google Scholar 

  4. G. Renda and J.L. Lowrance: Proc. Symp. on CCD Technology, JPL SP 43–21, 91 (1975)

    Google Scholar 

  5. P. Burstein, A.S. Krieger, M.J. Vanderhill, and R.B. Wattson: Proc. SPIE 143, 114 (1978)

    Article  ADS  Google Scholar 

  6. R.E. Griffiths, G. Polluci, A. Mak, S.S. Murray, D.A. Schwartz, and M.V. Zombeck: Proc. SPIE 244, 57 (1980)

    Article  ADS  Google Scholar 

  7. R. Melen and D. Buss: Charge-Coupled Devices: Technology and Applications, IEEE Press (1977)

    Google Scholar 

  8. J. Janesick, J. Hynecek, and M.M. Blouke: Proc. SPIE 290, 165 (1981)

    Article  ADS  Google Scholar 

  9. R.A. Stern, K. Liewer, and J.R. Janesick: Rev. Sci. Instrum. 54, 198 (1983)

    Article  ADS  Google Scholar 

  10. D.A. Schwartz, R.E. Griffiths, S.S. Murray, M.V. Zombeck, and W. Bradley: Proc. SPIE 184, 247 (1979)

    Article  ADS  Google Scholar 

  11. S. Marcus, R. Nelson, and R. Lynds: Proc. SPIE 172, 207 (1979)

    ADS  Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Fort Washington, American Science and Engineering, Inc., Cambridge, MA, 02139, USA

    P. Burstein & J. M. Davis

Authors
  1. P. Burstein
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. J. M. Davis
    View author publications

    You can also search for this author in PubMed Google Scholar

Editor information

Editors and Affiliations

  1. Forschungsgruppe Röntgenmikroskopie, Universität Göttingen, Universitätssternwarte, Geismarlandstraße 11, D-3400, Göttingen, Fed. Rep. of Germany

    Günter Schmahl  & Dietbert Rudolph  & 

Rights and permissions

Reprints and permissions

Copyright information

© 1984 Springer-Verlag Berlin Heidelberg

About this paper

Cite this paper

Burstein, P., Davis, J.M. (1984). The Detection of Soft X-Rays with Charged Coupled Detectors. In: Schmahl, G., Rudolph, D. (eds) X-Ray Microscopy. Springer Series in Optical Sciences, vol 43. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-38833-3_20

Download citation

  • DOI: https://doi.org/10.1007/978-3-540-38833-3_20

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-13547-1

  • Online ISBN: 978-3-540-38833-3

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics

Search

Navigation