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Grazing Incidence Optics for X-Ray Microscopy

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X-Ray Microscopy

Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 43))

Abstract

Considerable enthusiasm for x-ray microscopy was generated in the 1950s after some successful pioneering work in the subject [14.1 – 3]. This initial enthusiasm slowly evaporated after it became evident that the achievement of high resolution was beset with experimental difficulties related to the problems of producing very precisely figured and extremely smooth mirrors. However, since 1975 [14.4] there has been a renewal of interest in x-ray microscopy as a means of studying emissions from laser-generated plasmas and also as a technique for examining the microstructure of materials, to complement optical and electron microscopy [14.5].

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References

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Author information

Authors and Affiliations

  1. Division of Mechanical and Optical Metrology, National Physical Laboratory, Teddington, Middlesex, TW11 OLW, UK

    A. Franks & B. Gale

Authors
  1. A. Franks
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  2. B. Gale
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Editors and Affiliations

  1. Forschungsgruppe Röntgenmikroskopie, Universität Göttingen, Universitätssternwarte, Geismarlandstraße 11, D-3400, Göttingen, Fed. Rep. of Germany

    Günter Schmahl  & Dietbert Rudolph  & 

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© 1984 Springer-Verlag Berlin Heidelberg

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Franks, A., Gale, B. (1984). Grazing Incidence Optics for X-Ray Microscopy. In: Schmahl, G., Rudolph, D. (eds) X-Ray Microscopy. Springer Series in Optical Sciences, vol 43. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-38833-3_15

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  • DOI: https://doi.org/10.1007/978-3-540-38833-3_15

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-13547-1

  • Online ISBN: 978-3-540-38833-3

  • eBook Packages: Springer Book Archive

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