Advertisement

Enhanced Raman Scattering of Molecules Adsorbed on Ag, Cu and Au Surfaces

  • R. K. Chang
  • R. E. Benner
  • R. Dornhaus
  • K. U. von Raben
  • B. L. Laube
Part of the Springer Series in Optical Sciences book series (SSOS, volume 26)

Abstract

Raman spectroscopy has proved to be a valuable in situ technique for chemical speciation under conditions which are not amenable to the use of other diagnostic tools. S. P. S. PORTO recognized the potential of the method and completed pioneering work in this field by determining Raman cross sections and molecular symmetry for numerous molecules [1–4]. Until recently, however, spontaneous Raman spectroscopy was thought to lack sufficient sensitivity for chemical identification of monolayer adsorbates because of the smallness of the Raman cross sections under nonresonant conditions. Thus, the initial report of intense Raman scattering from pyridine adsorbed on Ag in an electrochemical cell [5] and the subsequent estimate [6,7] of the enhancement factor of 105 – 106 compared to pyridine in the electrolyte stimulated great excitement. Recent investigations on surface enhanced Raman scattering (SERS) have been aimed at determining the physical mechanisms responsible for SERS, as well as at establishing the generality of the effect and the extent to which it is limited by adsorbates, substrates, and the surrounding environment.

Keywords

Raman Cross Section Enha Ncement Wave Vector Selection Rule 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    S.P.S. Porto and D.L. Wood, J. Opt. Soc. Am. 52, 251 (1962).ADSCrossRefGoogle Scholar
  2. 2.
    J.M. Cherlow and S.P.S. Porto: “Laser Raman Spectroscopy of Gases”, in Laser Spectroscopy of Atoms and Molecules, ed. by H. Walther, Topics in Applied Physics, Vol. 2 (Springer, Berlin, Heidelberg, New York 1976) p. 255CrossRefGoogle Scholar
  3. 3.
    W.R. Fenner, H.A. Hyatt, J.M. Kellman, and S.P.S. Porto, J. Opt. Soc. Am. 63, 73 (1973).ADSCrossRefGoogle Scholar
  4. 4.
    W. Proffitt and S.P.S. Porto, J. Opt. Soc. Am. 63, 77 (1973).ADSCrossRefGoogle Scholar
  5. 5.
    M. Fleischmann, P.J. Hendra, and A.J. McQuillan, Chem. Phys. Lett. 26, 163 (1974).ADSCrossRefGoogle Scholar
  6. 6.
    D.L. Jeanmaire and R.P. Van Duyne, J. Electroanal. Chem. 84, 1 (1977).CrossRefGoogle Scholar
  7. 7.
    M.G. Albrecht and J.A. Creighton, J. Am. Chem. Soc. 99, 5215 (1977).CrossRefGoogle Scholar
  8. 8.
    E. Burstein, C.Y. Chen, and S. Lundqvist, in Light Scattering in Solids, edited by J.L. Birman, H.Z. Cummins, and K.K. Rebane (Plenum Press, New York, 1979), p. 479.CrossRefGoogle Scholar
  9. 9.
    E. Burstein and C.Y. Chen, in Proceedings of the 7th International Conference on Raman Spectroscopy, edited by W.F. Murphy (North-Holland Publishing Co., Amsterdam, 1980), p. 346.Google Scholar
  10. 10.
    T.E. Furtak and J. Reyes, Surf. Sci. 93, 351 (1980).ADSCrossRefGoogle Scholar
  11. 11.
    R.P. Van Duyne, in Chemical and Biochemical Application of Lasers, Vol. 4, edited by C.B. Moore (Academic Press, New York, 1978), p. 101.Google Scholar
  12. 12.
    A. Otto, Proceedings of the 6th Solid-Vacuum Interface Conference, Delft, The Netherlands, 1980 (to be published).Google Scholar
  13. 13.
    R. Dornhaus, M.B. Long, R.E. Benner, and R.K. Chang, Surf. Sci. 93, 240 (1980).ADSCrossRefGoogle Scholar
  14. 14.
    J. Billmann, G. Kovacs, and A. Otto, Surf. Sci. 92, 153 (1980).ADSCrossRefGoogle Scholar
  15. 15.
    A. Otto, J. Timper, J. Billmann, and I. Pockrand, Phys. Rev. Lett. 45, 46 (1980).ADSCrossRefGoogle Scholar
  16. 16.
    R.E. Benner, R. Dornhaus, R.K. Chang, and B.L. Laube, Surf. Sci. 101, 1980 (in press).Google Scholar
  17. 17.
    R.E. Benner, K.U. von Raben, R. Dornhaus, R.K. Chang, B.L. Laube, and F.A. Otter, Surf. Sci. (to be published).Google Scholar
  18. 18.
    J.P. Heritage and J.G. Bergman, in Light Scattering in Solids, edited by J.L. Birman, H.Z. Cummins, and K.K. Rebane (Plenum Press, New York, 1979), p. 167.CrossRefGoogle Scholar
  19. 19.
    L.H. Jones and R.A. Penneman, J. Chem. Phys. 22, 965 (1954).ADSCrossRefGoogle Scholar
  20. 20.
    L.H. Jones, J. Chem. Phys. 43, 594 (1965).ADSCrossRefGoogle Scholar
  21. 21.
    J.C. Tsang and J.R. Kirtley, Phys. Rev. Lett. 43, 477 (1979).ADSCrossRefGoogle Scholar
  22. 22.
    S.S. Jha, J.R. Kirtley, and J.C. Tsang, Phys. Rev. B (to be published).Google Scholar
  23. 23.
    E. Kretschmann, Z. Phys. 241, 313 (1971).ADSCrossRefGoogle Scholar
  24. 24.
    Y.J. Chen, W.P. Chen, and E. Burstein, Phys. Rev. Lett. 36, 1207 (1976).ADSCrossRefGoogle Scholar
  25. 25.
    H.J. Simon, D.E. Mitchell, and J.G. Watson, Am. J. Phys. 42, 630 (1975).ADSCrossRefGoogle Scholar
  26. 26.
    R. Dornhaus, R.E. Benner, R.K. Chang, and I. Chabay, Surf. Sci. 101, 1980 (in press).Google Scholar
  27. 27.
    R.E. Benner, R. Dornhaus, and R.K. Chang, Opt. Commun. 30, 145 (1979).ADSCrossRefGoogle Scholar
  28. 28.
    J.E. Rowe, C.V. Shank, D.Z. Zwemer, and C.A. Murray, Phys. Rev. Lett. 44, 1770 (1980).ADSCrossRefGoogle Scholar
  29. 29.
    E. Burstein, Y.J. Chen, C.Y. Chen, S. Lundqvist, and E. Tosatti, Solid State Commun. 29, 565 (1979).CrossRefGoogle Scholar
  30. 30.
    M. Moskovits, Solid State Commun. 32, 59 (1979).ADSCrossRefGoogle Scholar
  31. 31.
    S.L. McCall, P.M. Platzman, and P.A. Wolff, Phys. Lett. 77A, 381 (1980).CrossRefGoogle Scholar
  32. 32.
    M. Kerker, D.-S. Wang, and H. Chew, Appl. Opt. (to be published).Google Scholar
  33. 33.
    M. Moskovitz, J. Chem. Phys. 69, 4159 (1978).ADSCrossRefGoogle Scholar
  34. 34.
    J.A. Creighton, C.G. Blatchford, and M.C Albrecht, J. Chem. Soc, Faraday II 75, 790 (1979).CrossRefGoogle Scholar
  35. 35.
    J.A. Creighton, C.G. Blatchford, and J.R. Campbell, in Proceedings of the 7th International Conference on Raman Spectroscopy, edited by W.F. Murphy (North-Holland, Amsterdam, 1980), p. 398.Google Scholar
  36. 36.
    M. Kerker, O. Siiman, L.A. Bumm, and D.-S. Wang, Appl. Opt. (to be published).Google Scholar
  37. 37.
    A. Mooradian, Phys. Rev. Lett. 22, 185 (1969).ADSCrossRefGoogle Scholar
  38. 38.
    J.I. Gersten, R.L. Birke, and J.R. Lombardi, Phys. Rev. Lett. 43, 147 (1979).ADSCrossRefGoogle Scholar
  39. 39.
    C.A. Murray, D.L. Aliara, and M. Rhinewine, in Proceedings of the 7th International Conference on Raman Spectroscopy, edited by W.F. Murphy (North-Holland, Amsterdam, 1980), p. 406.Google Scholar
  40. 40.
    P.N. Sanda, J.M. Warlaumount, J.E. Demuth, J.C. Tsang, K. Christmann, and J.A. Bradley, Phys. Rev. Lett, (to be published).Google Scholar
  41. 41.
    I. Nenner and G.J. Schulz, J. Chem. Phys. 62, 1747 (1975)ADSCrossRefGoogle Scholar
  42. 41a.
    and G.J. Schulz, Rev. Mod. Phys. 45, 378 (1973).ADSCrossRefGoogle Scholar
  43. 42.
    B. Pettinger, in Proceedings of the 7th International Conference on Raman Spectroscopy, edited by W.F. Murphy (North-Holland Publishing Co, Amsterdam, 1980), p. 412.Google Scholar
  44. 43.
    J.I. Gersten and A. Nitzan, J. Chem. Phys. 73, 3023 (1980).ADSCrossRefGoogle Scholar
  45. 44.
    M. Kerker (private communication).Google Scholar
  46. 45.
    P.B. Johnson and R.W. Christy, Phys. Rev. B 6, 4370 (1972).ADSCrossRefGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1981

Authors and Affiliations

  • R. K. Chang
    • 1
  • R. E. Benner
    • 1
  • R. Dornhaus
    • 1
  • K. U. von Raben
    • 1
  • B. L. Laube
    • 2
  1. 1.Department of Engineering and Applied ScienceYale UniversityNew HavenUSA
  2. 2.United Technologies Research CenterEast HartfordUSA

Personalised recommendations