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Counting Statistics of Single Electron Transport in a Semiconductor Quantum Dot

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Part of the Advances in Solid State Physics book series (ASSP,volume 46)

Abstract

By using a quantum point contact as a charge detector, we show the measurement of current fluctuations in a semiconductor quantum dot by counting electrons tunneling through the system one by one. This method gives direct access to the full counting statistics of current fluctuations. In the sequential tunneling regime, we show the suppression of the noise compared to its classical Poissonian value, which is expected due to Coulomb blockade.

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Gustavsson, S. et al. (2008). Counting Statistics of Single Electron Transport in a Semiconductor Quantum Dot. In: Advances in Solid State Physics. Advances in Solid State Physics, vol 46. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-38235-5_3

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