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New AFM Developments to Study Elasticity and Adhesion at the Nanoscale

  • Robert Szoszkiewicz
  • Elisa Riedo
Part of the NanoScience and Technology book series (NANO)

Keywords

Contact Stiffness Indentation Curve Sample Contact Ultrasonic Amplitude Heterodyne Interferometer 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2007

Authors and Affiliations

  • Robert Szoszkiewicz
    • 1
  • Elisa Riedo
    • 1
  1. 1.School of PhysicsGeorgia Institute of TechnologyAtlantaUSA

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