Abstract

Proper characterisation of RF circuits is an important step within the design process. The measurements verify if the simulations hold and the IC hardware has been fabricated without significant process variations. Equipment with performances beyond that of the DUT (Device Under Test) is required making the measurement of high-speed circuits challenging and expensive. Today’s commercial equipment allows measurements at frequencies of up to 100 GHz. The costs for the basic equipment in an RF measurement laboratory may easily exceed 500 k€. In this section, we will review the key measurement techniques and components. Detailed discussions can be found in the specific literature [Bai85, Bry88, Sch99].

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References

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    Agilent tutorial notes, fundamentals of RF and microwave noise figure measurements, application note 57-1, 2005.Google Scholar
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    Agilent tutorial notes, Noise figure measurement accuracy — the Y-factor method, application note 57-2, 2005.Google Scholar
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Copyright information

© Springer-Verlag Berlin Heidelberg 2007

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