Abstract
In this book, the technique of lock-in thermography is being reviewed with special emphasis on its application to the characterization and functional testing of electronic components. The investigation of shunting phenomena in solar cells, which our lock-in thermography originally was developed for, among a lot of other applications is presented to demonstrate and discuss all the different possibilities of this rather new technique. We hope to have shown that the use of lock-in thermography instead of conventional (steady-state) thermography is a qualitatively new thermographic approach to electronic device testing and failure analysis.
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Breitenstein, O., Warta, W., Schubert, M.C. (2018). Summary and Outlook. In: Lock-in Thermography. Springer Series in Advanced Microelectronics, vol 10. Springer, Cham. https://doi.org/10.1007/978-3-319-99825-1_7
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DOI: https://doi.org/10.1007/978-3-319-99825-1_7
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Publisher Name: Springer, Cham
Print ISBN: 978-3-319-99824-4
Online ISBN: 978-3-319-99825-1
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