Physical and Technical Basics

Breitenstein, Otwin; Warta, Wilhelm; Schubert, Martin C.

doi:10.1007/978-3-319-99825-1_2

Physical and Technical Basics

Otwin Breitenstein¹¹,
Wilhelm Warta¹² &
Martin C. Schubert¹²

Chapter
First Online: 10 January 2019

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1 Citations

Part of the book series: Springer Series in Advanced Microelectronics ((MICROELECTR.,volume 10))

Abstract

First, in Sect. 2.1 the general basics of infrared (IR) thermography are briefly reviewed, which are also applicable to IR camera based lock-in thermography. In Sect. 2.2, the principles of the lock-in technique itself and of its digital realization are described.

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Authors and Affiliations

Max Planck Institute of Microstructure Physics, Halle, Germany
Otwin Breitenstein
Fraunhofer Institute for Solar Energy Systems, Freiburg, Germany
Wilhelm Warta & Martin C. Schubert

Authors

Otwin Breitenstein
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Wilhelm Warta
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Martin C. Schubert
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Correspondence to Otwin Breitenstein .

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Breitenstein, O., Warta, W., Schubert, M.C. (2018). Physical and Technical Basics. In: Lock-in Thermography. Springer Series in Advanced Microelectronics, vol 10. Springer, Cham. https://doi.org/10.1007/978-3-319-99825-1_2

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DOI: https://doi.org/10.1007/978-3-319-99825-1_2
Published: 10 January 2019
Publisher Name: Springer, Cham
Print ISBN: 978-3-319-99824-4
Online ISBN: 978-3-319-99825-1
eBook Packages: Physics and AstronomyPhysics and Astronomy (R0)

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