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Radiation Effects in CMOS Technology

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Radiation Hardened CMOS Integrated Circuits for Time-Based Signal Processing

Part of the book series: Analog Circuits and Signal Processing ((ACSP))

Abstract

This chapter will introduce the radiation effects that are encountered in modern CMOS technologies that have been used in this work. A summary of the effects and the potential problems will be discussed.

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Author information

Authors and Affiliations

  1. KU Leuven, Geel, Belgium

    Jeffrey Prinzie & Paul Leroux

  2. KU Leuven, Heverlee, Belgium

    Michiel Steyaert

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  1. Jeffrey Prinzie
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  2. Michiel Steyaert
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  3. Paul Leroux
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Prinzie, J., Steyaert, M., Leroux, P. (2018). Radiation Effects in CMOS Technology. In: Radiation Hardened CMOS Integrated Circuits for Time-Based Signal Processing . Analog Circuits and Signal Processing. Springer, Cham. https://doi.org/10.1007/978-3-319-78616-2_1

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  • DOI: https://doi.org/10.1007/978-3-319-78616-2_1

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-78615-5

  • Online ISBN: 978-3-319-78616-2

  • eBook Packages: EngineeringEngineering (R0)

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