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Practical Aspects of Kelvin Probe Force Microscopy in Liquids

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Book cover Kelvin Probe Force Microscopy

Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 65))

Abstract

There has been a strong demand for the development of scanning probe techniques that can map the distribution of surface charge and surface potential at nanometer scale in liquid media. While electrostatic force microscopy (EFM) and Kelvin probe force microscopy (KPFM) have routinely been used in vacuum and ambient conditions, they are not readily applicable in polar liquid media. In this chapter, we review the practical aspects of electrostatic and capacitive force detection in liquids and discuss the feasibility of measuring the surface charge or potential distribution in polar liquid media.

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Author information

Authors and Affiliations

  1. Kyoto University, Kyoto, Japan

    Kei Kobayashi & Hirofumi Yamada

Authors
  1. Kei Kobayashi
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  2. Hirofumi Yamada
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Corresponding author

Correspondence to Kei Kobayashi .

Editor information

Editors and Affiliations

  1. International Iberian Nanotechnology Laboratory, Braga, Portugal

    Sascha Sadewasser

  2. Department of Physics, University of Basel, Basel, Switzerland

    Thilo Glatzel

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Kobayashi, K., Yamada, H. (2018). Practical Aspects of Kelvin Probe Force Microscopy in Liquids. In: Sadewasser, S., Glatzel, T. (eds) Kelvin Probe Force Microscopy. Springer Series in Surface Sciences, vol 65. Springer, Cham. https://doi.org/10.1007/978-3-319-75687-5_4

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