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Layer-Resolved Photoemission Study of Doped Ag-Supported Ultrathin MgO Films

  • Thomas Jaouen
Conference paper
Part of the Springer Proceedings in Physics book series (SPPHY, volume 204)

Abstract

MgO/Ag(001) ultrathin films doped with interfacial Mg atoms are studied with layer-resolved Auger electron diffraction experiments, ultraviolet photoemission measurements, multiple scattering calculations, and density functional theory (DFT) calculations. The Mg atom intercalation at the MgO/Ag(001) interface induces a strong rumpling of the interface layers as well as a lowering of the work function related to interface electronic structure changes. DFT analysis of the metal-oxide interactions responsible for the interface dipole reproduces the experimental observations and reveals that the metal/oxide work function changes essentially originate in an increased electrostatic compression effect.

Notes

Acknowledgements

Collaboration and fruitful discussions with P. Aebi, S. Tricot, G. Delhaye, B. Lépine, D. Sébilleau, G. Jézéquel and P. Schieffer are gratefully acknowledged. Skillful technical assistance was provided by A. Le Pottier and Y. Claveau. Parts of this work have been funded by European FP7 MSNano network under Grant agreement n\(^{\circ }\) PIRSES-GA-2012-317554 and by COST Action MP1306 EUSpec. It has also been supported by the Fonds National Suisse pour la Recherche Scientifique through Division II.

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Copyright information

© Springer International Publishing AG, part of Springer Nature 2018

Authors and Affiliations

  1. 1.Département de Physique and Fribourg Center for NanomaterialsUniversité de FribourgFribourgSwitzerland

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