Abstract
We present here a new diagnostics based on using LiF crystal detectors that are able to perform measurements an intensity distribution of X-rays beams with diameters ranging from some microns up to some centimetres with high spatial resolution (~1 µm). In situ, 3D visualization of SACLA XFEL focused beam profile along propagation, including propagation inside photoluminescence solid materials, is demonstrated. Also, a high spatial resolution control a quality of targets used in optical laser pump—XFEL probe HEDS experiments is proposed.
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Acknowledgements
The XFEL experiments were performed at the BL3 of SACLA with the approval of the Japan Synchrotron Radiation Research Institute (JASRI) (Proposals Nos. 2014A8045, and 2014B8068). This research was partially supported by grants from Grants-in-Aid for Scientific Research (Kakenhi Grant No. 22224012, 25289244, and 15H02153) and the Core-to-Core Program on International Alliance for Material Science in Extreme States with High Power Laser of the Japan Society for the Promotion of Science (JSPS), from the X-ray Free Electron Laser Priority Strategy Program of the MEXT, contract 12005014. This work was carried out within the state assignment of FASO of Russia project #0044-2014-0037 and was partly supported by the Competitiveness Programme of NRNU MEFhI.
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Pikuz, T.A. et al. (2018). In Situ Characterization of XFEL Beam Intensity Distribution and Focusability by High-Resolution LiF Crystal Detector. In: Kawachi, T., Bulanov, S., Daido, H., Kato, Y. (eds) X-Ray Lasers 2016. ICXRL 2016. Springer Proceedings in Physics, vol 202. Springer, Cham. https://doi.org/10.1007/978-3-319-73025-7_17
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DOI: https://doi.org/10.1007/978-3-319-73025-7_17
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