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The Use of Backscatter Classification and Bathymetry Derivatives from Multibeam Data for Seabed Sediment Characterization

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Engineering Applications for New Materials and Technologies

Part of the book series: Advanced Structured Materials ((STRUCTMAT,volume 85))

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Abstract

The multibeam data provides backscatter and bathymetry accurate measurement of water depth information this valuable is related to the topography and composition of the seafloor. From multibeam dataset, the backscatter information and comprising bathymetry derivatives were interpreted using the ArcGIS software. The sediment samples from ground survey were collected using Ponar Grab and classified the size of sediment using Particle Size Analysis (PSA). The sieving method was also applied for coarse sediment samples. Ground survey data were used on verification and determination of sediment map accuracy produced by GIS analysis. In this study, maps of backscatter, bathymetry, slope and rugosity were developed and applied for developing seabed characterization classes. The result shows the seabed sediment from the study area was successfully developed with overall accuracy of 88.2% and kappa coefficient of 0.82. The study provided the opportunity on increasing the accuracy on determining the seabed sediment characteristic within the multibeam coverage area.

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Acknowledgements

The authors thanked the University Malaysia Terengganu (UMT) and Universiti Teknologi Malaysia (UTM) Razak School of Engineering and Advanced Technology, for research facilities and financial assistance provided for this project.

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Correspondence to Mohd Azhafiz Abdullah .

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Zakariya, R., Abdullah, M.A., Hasan, R.C., Khalil, I. (2018). The Use of Backscatter Classification and Bathymetry Derivatives from Multibeam Data for Seabed Sediment Characterization. In: Öchsner, A. (eds) Engineering Applications for New Materials and Technologies . Advanced Structured Materials, vol 85. Springer, Cham. https://doi.org/10.1007/978-3-319-72697-7_47

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  • DOI: https://doi.org/10.1007/978-3-319-72697-7_47

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  • Publisher Name: Springer, Cham

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