Skip to main content

Generating Cost-Aware Covering Arrays for Free

  • Conference paper
  • First Online:
  • 623 Accesses

Part of the book series: Communications in Computer and Information Science ((CCIS,volume 779))

Abstract

Software systems generally have a large number of configurable options interacting with each other. Such systems are more likely to be prone to errors, crashes, and faulty executions that are usually caused by option interactions. To avoid such errors, testing all possible configurations during the development phase is usually not feasible, since the number of all possible configurations is exponential in the order of number of options. A t-way covering array (CA) is a 2-dimensional combinatorial object that helps to efficiently cover all t-length option interactions of the system under test. Generating a CA with a small number of configurations is important to shorten the testing phase. However, the testing cost (e.g. the testing time) may differ from one configuration to another. Currently, most sequential tools can generate optimum CAs in terms of number of configurations, but they are not cost-aware, i.e., they cannot handle the varying costs of configurations. In this work, we implement a parallel, cost-aware CA-generation tool based on a sequential tool, Jenny, to generate lower-cost CAs faster. Experimental results show that our cost-aware CA construction approach can generate \(32\%\) and \(21\%\) lower cost CAs on average for t = 2 and t = 3, respectively, compared to state-of-the-art CA-generation tools. Moreover, the cost-awareness comes for free, i.e., we speed up our algorithm by leveraging parallel computation. The cost models and cost reduction techniques we propose could also be adapted for other existing CA generation tools.

This is a preview of subscription content, log in via an institution.

Buying options

Chapter
USD   29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD   39.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD   54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Learn about institutional subscriptions

References

  1. Kuhn, D.R., Wallace, D.R., Gallo Jr., A.M.: Software fault interactions and implications for software testing. IEEE Trans. Software Eng. 30(6), 418–421 (2004)

    Article  Google Scholar 

  2. Yilmaz, C., Fouche, S., Cohen, M.B., Porter, A., Demiroz, G., Koc, U.: Moving forward with combinatorial interaction testing. Computer 2, 37–45 (2014)

    Article  Google Scholar 

  3. Nie, C., Leung, H.: A survey of combinatorial testing. ACM Comput. Surv. (CSUR) 43(2), 11 (2011)

    Article  MATH  Google Scholar 

  4. Seroussi, G., Bshouty, N.H.: Vector sets for exhaustive testing of logic circuits. IEEE Trans. Inf. Theory 34(3), 513–522 (1988)

    Article  MathSciNet  MATH  Google Scholar 

  5. Lei, Y., Tai, K.-C.: In-parameter-order: a test generation strategy for pairwise testing. In: High-Assurance Systems Engineering Symposium, Proceedings Third IEEE International, pp. 254–261. IEEE (1998)

    Google Scholar 

  6. Cohen, M.B., Colbourn, C.J., Ling, A.C.: Augmenting simulated annealing to build interaction test suites. In: 14th International Symposium on Software Reliability Engineering, ISSRE 2003, pp. 394–405. IEEE (2003)

    Google Scholar 

  7. Czerwonka, J.: Pairwise testing in the real world: practical extensions to test-case scenarios. In: Proceedings of 24th Pacific Northwest Software Quality Conference, pp. 419–430. Citeseer (2006)

    Google Scholar 

  8. Lei, Y., Kacker, R., Kuhn, D.R., Okun, V., Lawrence, J.: Ipog/ipog-d: efficient test generation for multi-way combinatorial testing. Softw. Test. Verification Reliab. 18(3), 125–148 (2008)

    Article  Google Scholar 

  9. Garvin, B.J., Cohen, M.B., Dwyer, M.B.: Evaluating improvements to a meta-heuristic search for constrained interaction testing. Empirical Softw. Eng. 16(1), 61–102 (2011)

    Article  Google Scholar 

  10. Khalsa, S.K., Labiche, Y.: An orchestrated survey of available algorithms and tools for combinatorial testing. In: 2014 IEEE 25th International Symposium on Software Reliability Engineering (ISSRE), pp. 323–334. IEEE (2014)

    Google Scholar 

  11. Demiroz, G., Yilmaz, C.: Cost-aware combinatorial interaction testing. In: In the Proceedings of VALID 2012, The Fourth International Conference on Advances in System Testing and Validation Lifecycle, pp. 9–16, November 2012

    Google Scholar 

  12. Demiroz, G., Yilmaz, C.: Using simulated annealing for computing cost-aware covering arrays. Appl. Soft Comput. 49, 1129–1144 (2016)

    Article  Google Scholar 

  13. Demiroz, G.: Cost-aware combinatorial interaction testing (doctoral symposium). In: Proceedings of the 2015 International Symposium on Software Testing and Analysis (ISSTA 2015), pp. 440–443. ACM, July 2015

    Google Scholar 

  14. Bryce, R.C., Colbourn, C.J.: Prioritized interaction testing for pair-wise coverage with seeding and constraints. Inf. Softw. Technol. 48(10), 960–970 (2006). Advances in Model-based Testing

    Article  Google Scholar 

  15. Jenkins, B.: jenny: A pairwise testing tool (2005). http://www.burtleburtle.net/bob/index.html

  16. Pairwise testing available tools. http://www.pairwise.org/tools.asp

  17. Johansen, M.F., Haugen, O., Fleurey, F.: An algorithm for generating t-wise covering arrays from large feature models. In: Proceedings of the 16th International Software Product Line Conference, SPLC 2012, vol. 1, pp. 46–55. ACM (2012)

    Google Scholar 

  18. Demiroz, G., Yilmaz, C.: Towards automatic cost model discovery for combinatorial interaction testing. In: Proceedings of the 2016 International Workshop on Combinatorial Testing (IWCT 2016). IEEE, April 2016

    Google Scholar 

  19. Yu, L., Lei, Y., Kacker, R.N., Kuhn, D.R.: Acts: a combinatorial test generation tool. In: 2013 IEEE Sixth International Conference on Software Testing, Verification and Validation (ICST), pp. 370–375. IEEE (2013)

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Mustafa Kemal Taş .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2018 Springer International Publishing AG

About this paper

Check for updates. Verify currency and authenticity via CrossMark

Cite this paper

Taş, M.K., Mercan, H., Demiröz, G., Kaya, K., Yilmaz, C. (2018). Generating Cost-Aware Covering Arrays for Free. In: Itsykson, V., Scedrov, A., Zakharov, V. (eds) Tools and Methods of Program Analysis. TMPA 2017. Communications in Computer and Information Science, vol 779. Springer, Cham. https://doi.org/10.1007/978-3-319-71734-0_15

Download citation

  • DOI: https://doi.org/10.1007/978-3-319-71734-0_15

  • Published:

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-71733-3

  • Online ISBN: 978-3-319-71734-0

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics