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Conventional Test Methods

  • Selahattin Sayil
Chapter

Abstract

With shrinking sizes of devices and increasing chip densities, circuits have become so fast, compact, and inaccessible that the use of conventional methods based on mechanical probe has become limited and inadequate. The conventional test methods or the mechanical probe techniques used for functional and internal fault testing face increasingly difficult challenges. This chapter discusses these limitations of conventional methods and highlights the importance of alternative probing solutions to address the upcoming challenges.

Keywords

VLSI testing Mechanical probe Conventional methods 

References

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Copyright information

© Springer International Publishing AG 2018

Authors and Affiliations

  • Selahattin Sayil
    • 1
  1. 1.Lamar UniversityBeaumontUSA

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