Skip to main content

Ellipsometric Control of Laser Welded Materials

  • Conference paper
  • First Online:
Book cover Recent Advances in Technology Research and Education (INTER-ACADEMIA 2017)

Part of the book series: Advances in Intelligent Systems and Computing ((AISC,volume 660))

Included in the following conference series:

  • 1279 Accesses

Abstract

The results of ellipsometric diagnostic of femtosecond laser welded fused silica-silica, fused silica-copper and fused silica-silicon samples are presented. The bonded interface of each sample is composed of numerous laser weld seams at their periphery in a closed shape pattern so as to seal the inner part due to optical contact of two species. The angular dependencies of ellipsometric parameters Δ and Ψ were obtained for the several areas of bonded interface of each sample, namely: laser weld seam at the periphery and laser sealing inner part. The parameter Δ abrupt changes in the vicinity of the Brewster’s angle \( {{\upvarphi}}_{\text{B}} \) for the weld seam of the fused silica-silica sample while the dependence Δ(\( {{\upvarphi}} \)) (\( {{\upvarphi}} \) is an angle of light incidence) for optical transmission window is characterized by smoother curve. The value of \( {{\upvarphi}}_{\text{B}} \) for the weld seam is slightly less than the value \( {{\upvarphi}}_{\text{B}} \) of optical transmission window for this sample by 0.2°. Such behavior of ellipsometric parameter Δ may be explained by the material modification inside glass due to femtosecond laser irradiation. This change is typically characterized by densification and caused by variation in the refractive index, and it may be also characterized by a strong birefringence inside the welded area.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 129.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 169.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Plobl, A., Krauter, G.: Wafer direct bonding: tailoring adhesion between brittle materials. Mater. Sci. Eng. R 25, 1–88 (1999)

    Article  Google Scholar 

  2. Krauter, G., Schumacher, A., Gosele, U.: Low temperature silicon direct bonding for application in micromechanics: bonding energies for different combination of oxides. Sens. Actuators A 70, 271–275 (1998)

    Article  Google Scholar 

  3. Hunt, C.E., Desmond, C.A., Ciarlo, D.R., Bennett, W.J.: Direct bonding of micromachined silicon wafers for laser diode heat exchanger applications. J. Micromech. Microeng. 1(3), 152–156 (1991)

    Article  Google Scholar 

  4. Hélie, D., Lacroix, F., Vallée, R.: Reinforced direct bonding of optical materials by femtosecond laser welding. Appl. Opt. 51(12), 2098–2106 (2012)

    Article  Google Scholar 

  5. Hélie, D., Lacroix, F., Vallée, R.: Reinforcing a direct bond between optical materials by filamentation based femtosecond laser welding. JLMN-J. Laser Micro/Nanoeng. 7(3), 163–169 (2012)

    Google Scholar 

  6. Tamaki, T., Watanabe, W., Itoh, K.: Laser micro-welding of transparent materials by a localized heat accumulation effect using a femtosecond fiber laser at 1558 nm. Opt. Express 14(22), 10460–10468 (2006)

    Article  Google Scholar 

  7. Azzam, R.M.A., Bashara, N.M.: Ellipsometry and Polarized Light. Elsevier Science Ltd, Amsterdam (1987)

    Google Scholar 

  8. Gnatyuk, V.A., Kanev, K.D., Mizeikis, V., Aoki, T., Gagarsky, S.V., Poperenko, L.V.: Laser volumetric marking and recording of digital information. In: Proceedings of the 11th International Conference on Global Research and Education in Engineers for Better Life “INTER-ACADEMIA 2012”, pp. 189–200, Budapest, Hungary (2012)

    Google Scholar 

  9. Gnatyuk, V.A., Vlasenko, O.I., Levytskyi, S.N., Gagarsky, S.V., Zelenska, K.S., Poperenko, L.V., Aoki, T.: Laser marking in transparent materials and mechanisms of laser-induced defect formation laser-induced marks as information carriers in digital encoding. In: Proceedings of the 2014 Fotonica AEIT Italian Conference on Photonics Technologies, p. 6843885, Naples, Italy (2014)

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Maryana M. Negrub .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2018 Springer International Publishing AG

About this paper

Cite this paper

Negrub, M.M., Hélie, D., Yurgelevych, I.V., Poperenko, L.V. (2018). Ellipsometric Control of Laser Welded Materials. In: Luca, D., Sirghi, L., Costin, C. (eds) Recent Advances in Technology Research and Education. INTER-ACADEMIA 2017. Advances in Intelligent Systems and Computing, vol 660. Springer, Cham. https://doi.org/10.1007/978-3-319-67459-9_4

Download citation

  • DOI: https://doi.org/10.1007/978-3-319-67459-9_4

  • Published:

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-67458-2

  • Online ISBN: 978-3-319-67459-9

  • eBook Packages: EngineeringEngineering (R0)

Publish with us

Policies and ethics