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Influence of Measurement Parameters Settings on the Results of the CT Measurement

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Mechatronics 2017 (MECHATRONICS 2017)

Part of the book series: Advances in Intelligent Systems and Computing ((AISC,volume 644))

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Abstract

Nowadays X-ray computed tomography for industrial applications is most frequently used for defectoscopy analysis or nondestructive testing. However, it is increasingly used for geometric measurements. The accuracy of geometric measurements is influenced by many factors such as: measurement parameters (X-ray tube and detector settings), environmental conditions, reconstruction algorithms, element alignment, threshold value etc. The article presents the influence of setting parameters of the X-ray tube (voltage and current) and detector (integration time and gain) on the results of geometric measurements. Studies were performed using Carl Zeiss computer tomograph METROTOM 800. Ceramic balls (Si3N4) of G5 accuracy class were selected as the reference master artifacts.

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Acknowledgements

The research has been partially funded from Ministry of Science and Higher Education in Poland decision no 5339/E-365/SPUB/2016/1 statutory activity no 504/02827/1142 and from the research budget for 2013-2016 as a research project PBS2/B6/16/2013 of The National Centre for Research and Development of Poland.

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Authors and Affiliations

  1. Faculty of Mechatronics, Institute of Metrology and Biomedical Engineering, Warsaw University of Technology, Warsaw, Poland

    Tomasz Kowaluk & Adam Woźniak

Authors
  1. Tomasz Kowaluk
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  2. Adam Woźniak
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Corresponding author

Correspondence to Tomasz Kowaluk .

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Editors and Affiliations

  1. Faculty of Mechanical Engineering, Institute of Mathematics, Brno University of Technology, Brno, Czech Republic

    Tomáš Březina

  2. Faculty of Mechatronics, Institute of Metrology and Biomedical Engineering, Warsaw University of Technology, Warsaw, Poland

    Ryszard Jabłoński

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Kowaluk, T., Woźniak, A. (2018). Influence of Measurement Parameters Settings on the Results of the CT Measurement. In: Březina, T., Jabłoński, R. (eds) Mechatronics 2017. MECHATRONICS 2017. Advances in Intelligent Systems and Computing, vol 644. Springer, Cham. https://doi.org/10.1007/978-3-319-65960-2_75

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  • DOI: https://doi.org/10.1007/978-3-319-65960-2_75

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-65959-6

  • Online ISBN: 978-3-319-65960-2

  • eBook Packages: EngineeringEngineering (R0)

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