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Radiation Damage in Silicon Detector Devices

Chapter
Part of the Springer Tracts in Modern Physics book series (STMP, volume 275)

Abstract

The intent of this chapter is to introduce the radiation effects and give a general understanding of radiation damage – its mechanism, microscopic and macroscopic effects.

Copyright information

© Springer International Publishing AG 2017

Authors and Affiliations

  1. 1.Karlsruhe Institute of Technology (KIT)Eggenstein-LeopoldshafenGermany

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