Abstract
Virtual prototyping of Analog/Mixed-Signal (AMS) systems is a key concern in modern SoC verification. Achieving first-time right designs is a challenging task: Every relevant functional and non-functional property has to be examined throughout the complete design process. Many faulty designs have been verified carefully before tape out but are still missing at least one low-level effect which arises from interaction between one or more system components. Since these extra-functional effects are often neglected on system level, the design cannot be rectified in early design stages or verified before fabrication. We introduce a method to determine system acceptance regions tackling this challenge: We include extra-functional effects into the system models, and we investigate their behavior with parallel simulations in combination with an accelerated analog simulation scheme. The accelerated simulation approach is based on local linearizations of nonlinear circuits, which result in piecewise-linear systems. High-level simulation speed-up is achieved by avoiding numerical integration and using parallel computing. This approach is fully automated requiring only a circuit netlist. To reduce the overall number of simulations, we use an adaptive sampling algorithm for exploring systems acceptance regions which indicate feasible and critical operating conditions of the AMS system.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
Dietrich, S., Sandner, H., Vanselow, F., Wunderlich, R., & Heinen, S. (2012). In 2012 IEEE 10th International New Circuits and Systems Conference (NEWCAS) (pp. 369–372). DOI 10.1109/NEWCAS.2012. 6329033.
Dobler, M., Harrant, M., Rafaila, M., Pelz, G., Rosenstiel, W., & Bogdan, M. (2015). 2015 Design, Automation Test in Europe Conference Exhibition (DATE) (pp. 1036–1041).
Kundert, K., Chang, H., Jefferies, D., Lamant, G., Malavasi, E., & Sendig, F. (2000) IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 19(12), 1561. DOI 10.1109/43.898832.
Alassir, M., Denoulet, J., Romain, O., & Garda, P. (2013). IEEE Transactions on Components, Packaging and Manufacturing Technology, 3(12), 2081. DOI 10.1109/TCPMT.2013.2262151. http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=6531653.
Bai, X., & Dey, S. (2004). IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 23(9), 1355. DOI 10.1109/TCAD.2004.833612. http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=1327675.
Barke, E., Fürtig, A., Gläser, G., Grimm, C., Hedrich, L., Heinen, S., et al. (2016). 2016 Design, Automation Test in Europe Conference Exhibition (DATE).
Eo, Y., Shin, S., Eisenstadt, W. R., & Shim, J. (2002). IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 21(12), 1489. DOI 10.1109/TCAD.2002.804381.
Leveugle, R., & Ammari, A. (2004). Proceedings Design, Automation and Test in Europe Conference and Exhibition, 2004 (Vol. 1, pp. 590–595). DOI 10.1109/DATE.2004.1268909.
Rafaila, M., Decker, C., Grimm, C., Kirscher, J., & Pelz, G. (2010). 2010 Forum on Specification and Design Languages (FDL 2010) (pp. 1–6). London: IET.
Stehr, G., Graeb, H. E., & Antreich, K. J. (2007). IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 26(10), 1733. DOI 10.1109/TCAD.2007.895756.
Zaum, D., Hoelldampf, S., Olbrich, M., Barke, E., & Neumann, I. (2010). 2010 Forum on Specification Design Languages (FDL 2010) (pp. 1–6). DOI 10.1049/ic.2010.0158.
Hoelldampf, S., Zaum, D., Neumann, I., Olbrich, M., & Barke, E. (2011). 2011 IEEE International Systems Conference (SysCon) (pp. 527–530). DOI 10.1109/SYSCON.2011.5929046.
Barnasconi, M., Einwich, K., Grimm, C., Maehne, T., Vachoux, A., et al. (2013). Standard system ams extensions 2.0 language reference manual. Accellera Systems Initiative (ASI).
clang: a C language family frontend for LLVM. http://clang.llvm.org/.
Mako Templates for Python. http://www.makotemplates.org/.
Hoelldampf, S., Lee, H. S. L., Zaum, D., Olbrich, M., & Barke, E. (2012). Proceedings of IEEE International SOC Conference (SOCC).
Garland, M., & Heckbert, P. S. (1998). Proceedings of IEEE Visualization (Vis) (pp. 263–269)
Lindstrom, P., & Turk, G. (1999). IEEE Transactions on Visualization and Computer Graphics, 5(2), 98.
Bemporad, A., Ferrari-Trecate, G., Morari, M., et al. (2000). IEEE Transactions on Automatic Control, 45(10), 1864.
Lee, H. S. L., Althoff, M., Hoelldampf, S., Olbrich, M., & Barke, E. (2015). 2015 20th Asia and South Pacific Design Automation Conference (ASP-DAC) (pp. 725–730). Piscataway, NJ: IEEE.
Chua, L., & Deng, A. C. (1986). IEEE Transactions on Circuits and Systems, 33(5), 511. DOI 10.1109/TCS.1986.1085952.
Chen, W. K. (2009). Feedback, nonlinear, and distributed circuits (3rd ed.). Boca Raton, FL: CRC Press/Taylor and Francis.
Zhang, Y., Sankaranarayanan, S., & Somenzi, F. (2012). Formal methods in computer-aided design (FMCAD), 2012 (pp. 196–203).
Baker, K., & von Beers, J. (1996). Proceedings of the International Test Conference, 1996 (pp. 932–933). DOI 10.1109/TEST.1996.557162.
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2018 Springer International Publishing AG
About this chapter
Cite this chapter
Gläser, G., Lee, HS.L., Olbrich, M., Barke, E. (2018). Knowing Your AMS System’s Limits: System Acceptance Region Exploration by Using Automated Model Refinement and Accelerated Simulation. In: Fummi, F., Wille, R. (eds) Languages, Design Methods, and Tools for Electronic System Design. Lecture Notes in Electrical Engineering, vol 454. Springer, Cham. https://doi.org/10.1007/978-3-319-62920-9_1
Download citation
DOI: https://doi.org/10.1007/978-3-319-62920-9_1
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-319-62919-3
Online ISBN: 978-3-319-62920-9
eBook Packages: EngineeringEngineering (R0)