Skip to main content

Knowing Your AMS System’s Limits: System Acceptance Region Exploration by Using Automated Model Refinement and Accelerated Simulation

  • Chapter
  • First Online:
Languages, Design Methods, and Tools for Electronic System Design

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 454))

  • 390 Accesses

Abstract

Virtual prototyping of Analog/Mixed-Signal (AMS) systems is a key concern in modern SoC verification. Achieving first-time right designs is a challenging task: Every relevant functional and non-functional property has to be examined throughout the complete design process. Many faulty designs have been verified carefully before tape out but are still missing at least one low-level effect which arises from interaction between one or more system components. Since these extra-functional effects are often neglected on system level, the design cannot be rectified in early design stages or verified before fabrication. We introduce a method to determine system acceptance regions tackling this challenge: We include extra-functional effects into the system models, and we investigate their behavior with parallel simulations in combination with an accelerated analog simulation scheme. The accelerated simulation approach is based on local linearizations of nonlinear circuits, which result in piecewise-linear systems. High-level simulation speed-up is achieved by avoiding numerical integration and using parallel computing. This approach is fully automated requiring only a circuit netlist. To reduce the overall number of simulations, we use an adaptive sampling algorithm for exploring systems acceptance regions which indicate feasible and critical operating conditions of the AMS system.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 84.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 109.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Dietrich, S., Sandner, H., Vanselow, F., Wunderlich, R., & Heinen, S. (2012). In 2012 IEEE 10th International New Circuits and Systems Conference (NEWCAS) (pp. 369–372). DOI 10.1109/NEWCAS.2012. 6329033.

    Google Scholar 

  2. Dobler, M., Harrant, M., Rafaila, M., Pelz, G., Rosenstiel, W., & Bogdan, M. (2015). 2015 Design, Automation Test in Europe Conference Exhibition (DATE) (pp. 1036–1041).

    Google Scholar 

  3. Kundert, K., Chang, H., Jefferies, D., Lamant, G., Malavasi, E., & Sendig, F. (2000) IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 19(12), 1561. DOI 10.1109/43.898832.

    Article  Google Scholar 

  4. Alassir, M., Denoulet, J., Romain, O., & Garda, P. (2013). IEEE Transactions on Components, Packaging and Manufacturing Technology, 3(12), 2081. DOI 10.1109/TCPMT.2013.2262151. http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=6531653.

    Article  Google Scholar 

  5. Bai, X., & Dey, S. (2004). IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 23(9), 1355. DOI 10.1109/TCAD.2004.833612. http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=1327675.

    Article  Google Scholar 

  6. Barke, E., Fürtig, A., Gläser, G., Grimm, C., Hedrich, L., Heinen, S., et al. (2016). 2016 Design, Automation Test in Europe Conference Exhibition (DATE).

    Google Scholar 

  7. Eo, Y., Shin, S., Eisenstadt, W. R., & Shim, J. (2002). IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 21(12), 1489. DOI 10.1109/TCAD.2002.804381.

    Article  Google Scholar 

  8. Leveugle, R., & Ammari, A. (2004). Proceedings Design, Automation and Test in Europe Conference and Exhibition, 2004 (Vol. 1, pp. 590–595). DOI 10.1109/DATE.2004.1268909.

    Google Scholar 

  9. Rafaila, M., Decker, C., Grimm, C., Kirscher, J., & Pelz, G. (2010). 2010 Forum on Specification and Design Languages (FDL 2010) (pp. 1–6). London: IET.

    Google Scholar 

  10. Stehr, G., Graeb, H. E., & Antreich, K. J. (2007). IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 26(10), 1733. DOI 10.1109/TCAD.2007.895756.

    Article  Google Scholar 

  11. Zaum, D., Hoelldampf, S., Olbrich, M., Barke, E., & Neumann, I. (2010). 2010 Forum on Specification Design Languages (FDL 2010) (pp. 1–6). DOI 10.1049/ic.2010.0158.

    Google Scholar 

  12. Hoelldampf, S., Zaum, D., Neumann, I., Olbrich, M., & Barke, E. (2011). 2011 IEEE International Systems Conference (SysCon) (pp. 527–530). DOI 10.1109/SYSCON.2011.5929046.

    Google Scholar 

  13. Barnasconi, M., Einwich, K., Grimm, C., Maehne, T., Vachoux, A., et al. (2013). Standard system ams extensions 2.0 language reference manual. Accellera Systems Initiative (ASI).

    Google Scholar 

  14. clang: a C language family frontend for LLVM. http://clang.llvm.org/.

  15. Mako Templates for Python. http://www.makotemplates.org/.

  16. Hoelldampf, S., Lee, H. S. L., Zaum, D., Olbrich, M., & Barke, E. (2012). Proceedings of IEEE International SOC Conference (SOCC).

    Google Scholar 

  17. Garland, M., & Heckbert, P. S. (1998). Proceedings of IEEE Visualization (Vis) (pp. 263–269)

    Google Scholar 

  18. Lindstrom, P., & Turk, G. (1999). IEEE Transactions on Visualization and Computer Graphics, 5(2), 98.

    Article  Google Scholar 

  19. Bemporad, A., Ferrari-Trecate, G., Morari, M., et al. (2000). IEEE Transactions on Automatic Control, 45(10), 1864.

    Article  MathSciNet  Google Scholar 

  20. Lee, H. S. L., Althoff, M., Hoelldampf, S., Olbrich, M., & Barke, E. (2015). 2015 20th Asia and South Pacific Design Automation Conference (ASP-DAC) (pp. 725–730). Piscataway, NJ: IEEE.

    Google Scholar 

  21. Chua, L., & Deng, A. C. (1986). IEEE Transactions on Circuits and Systems, 33(5), 511. DOI 10.1109/TCS.1986.1085952.

    Article  Google Scholar 

  22. Chen, W. K. (2009). Feedback, nonlinear, and distributed circuits (3rd ed.). Boca Raton, FL: CRC Press/Taylor and Francis.

    MATH  Google Scholar 

  23. Zhang, Y., Sankaranarayanan, S., & Somenzi, F. (2012). Formal methods in computer-aided design (FMCAD), 2012 (pp. 196–203).

    Google Scholar 

  24. Baker, K., & von Beers, J. (1996). Proceedings of the International Test Conference, 1996 (pp. 932–933). DOI 10.1109/TEST.1996.557162.

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Georg Gläser .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2018 Springer International Publishing AG

About this chapter

Check for updates. Verify currency and authenticity via CrossMark

Cite this chapter

Gläser, G., Lee, HS.L., Olbrich, M., Barke, E. (2018). Knowing Your AMS System’s Limits: System Acceptance Region Exploration by Using Automated Model Refinement and Accelerated Simulation. In: Fummi, F., Wille, R. (eds) Languages, Design Methods, and Tools for Electronic System Design. Lecture Notes in Electrical Engineering, vol 454. Springer, Cham. https://doi.org/10.1007/978-3-319-62920-9_1

Download citation

  • DOI: https://doi.org/10.1007/978-3-319-62920-9_1

  • Published:

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-62919-3

  • Online ISBN: 978-3-319-62920-9

  • eBook Packages: EngineeringEngineering (R0)

Publish with us

Policies and ethics