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Antenna Measurements at Millimeter and Submillimeter Wavelengths

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Aperture Antennas for Millimeter and Sub-Millimeter Wave Applications

Part of the book series: Signals and Communication Technology ((SCT))

Abstract

Testing of electrically large, high-gain antennas as well as that of small integrated antennas at millimeter and submillimeter wavelengths is extremely challenging. Basically, there are three methods for measuring radiation properties of an antenna: the far-field method, the near-field method, and the compact antenna test range (CATR). In case of large antennas, the classical far-field method has two major obstacles at mm and submm wavelengths: impractically large measurement distance and high atmospheric loss. The planar near-field scanning method has been used up to 1 THz. However, the applied near-field methods often give useful information only on the main beam and its vicinity, because the field-sampling is typically very sparse. Reflector-based and hologram-based compact antenna test range (CATR) measurements have been demonstrated up to 500 GHz and 650 GHz, respectively. In the case of small integrated antennas, various techniques for on-wafer measurements have been developed. This chapter discusses the theory, techniques and limitations of the various test methods—the far-field method, planar near-field scanning and CATR as well as on-wafer measurements. Also, antenna pattern correction techniques are discussed.

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Authors and Affiliations

  1. School of Electrical Engineering, Department of Electronics and Nanoengineering, Aalto University, Espoo, Finland

    Antti V. Räisänen, Juha Ala-Laurinaho & Ville Viikari

  2. Virginia Diodes, Inc., Charlottesville, VA, USA

    Thomas Crowe

  3. Antenna Systems Solutions S.L., Santander, Spain

    Sergiy Pivnenko

  4. Dpto. Señales, Sistemas Y Radiocomunicaciones, ETSI Telecomunicación, Universidad Politécnica de Madrid (UPM), Madrid, Spain

    Manuel Sierra Castañer

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  1. Antti V. Räisänen
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  2. Juha Ala-Laurinaho
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  3. Thomas Crowe
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  4. Sergiy Pivnenko
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  5. Manuel Sierra Castañer
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  6. Ville Viikari
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Correspondence to Antti V. Räisänen .

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  1. Technicolor R&D France, Cesson-Sévigné, France

    Artem Boriskin

  2. IETR, Université de Rennes 1, Rennes, France

    Ronan Sauleau

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Räisänen, A.V., Ala-Laurinaho, J., Crowe, T., Pivnenko, S., Castañer, M.S., Viikari, V. (2018). Antenna Measurements at Millimeter and Submillimeter Wavelengths. In: Boriskin, A., Sauleau, R. (eds) Aperture Antennas for Millimeter and Sub-Millimeter Wave Applications. Signals and Communication Technology. Springer, Cham. https://doi.org/10.1007/978-3-319-62773-1_12

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