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Point-Group Sensitive Orientation Mapping Using EBSD

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Proceedings of the 6th International Conference on Recrystallization and Grain Growth (ReX&GG 2016)

Abstract

We demonstrate polarity-sensitive orientation mapping of non-centrosymmetric phases by Electron Backscatter Diffraction (EBSD) [1,2]. The method overcomes the restrictions of kinematic orientation determination by EBSD, which is limited to the centrosymmetric Laue-groups connected with Friedel’s rule. Different cubic and hexagonal materials (GaN, ZnO) are tested in a quantitative pattern matching approach based on simulations using the dynamical theory of electron diffraction. This procedure results in a distinct assignment of the local orientation in complex materials according to the non-centrosymmetric point group of the crystal structure.

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References

  1. Winkelmann A., Nolze G., Appl. Phys. Lett. 106, 072101 (2015)

    Article  Google Scholar 

  2. Nolze G., Grosse C., Winkelmann A., J. Appl. Cryst. 48, 1405 (2015)

    Article  Google Scholar 

  3. Winkelmann A., Nolze G., Ultramicroscopy 149, 58 (2015)

    Article  Google Scholar 

  4. Lebedev V., Tonisch, K., Niebelschütz, F., Cimalla, V., Cengher, D., Cimalla, I., Mauder, Ch., Hauguth, S., Ambacher, O., Morales, F. M., Lozano, J. G., González, D., J. Appl. Phys. 101, 054906 (2007)

    Article  Google Scholar 

  5. Lorenz P., Lebedev V., Niebelschütz F., Hauguth S., Ambacher O., Schaefer J. A., Krischok S., Phys. Status Solidi (c) 5, 1965–1967 (2008)

    Article  Google Scholar 

  6. Bachmann F., Hielscher R., Schaeben H., Solid State Phenomena, 160, 63 (2010)

    Article  Google Scholar 

  7. McCoy M. A., Grimes R. W., Lee W. E., J. Mater. Res. 11, 2009 (1996)

    Article  Google Scholar 

  8. Schloffer M, Teichert C., Supancic P., Andreev A., Hou Y., Wang Z., J. European Ceramic Society 30, 1761 (2010)

    Article  Google Scholar 

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Author information

Authors and Affiliations

  1. Bruker Nano GmbH, Berlin, Germany

    Aimo Winkelmann

  2. Bundesanstalt für Materialforschung und -prüfung BAM, Berlin, Germany

    Gert Nolze

  3. Technische Universität Ilmenau, Germany

    Marcel Himmerlich

  4. Fraunhofer Institute for Applied Solid State Physics, Freiburg, Germany

    Vadim Lebedev

  5. Graz University of Technology, Austria

    Angelika Reichmann

Authors
  1. Aimo Winkelmann
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  2. Gert Nolze
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  3. Marcel Himmerlich
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  4. Vadim Lebedev
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  5. Angelika Reichmann
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Editor information

Editors and Affiliations

  1. Carnegie Mellon University, USA

    Elizabeth A. Holm (Professor of Materials Science and Engineering), Gregory S. Rohrer Ph.D.  & Anthony D. Rollett (Professor of Materials Science and Engineering) (Professor of Materials Science and Engineering),  &  (Professor of Materials Science and Engineering)

  2. Research and Technology Center, U. S. Steel Corporation, USA

    Susan Farjami (Senior research engineer) (Senior research engineer)

  3. Robert Morris University, Pittsburgh, PA, USA

    Priyadarshan Manohar (Associate Professor of Engineering and Co-Director Research and Outreach Center (ROC) (Associate Professor of Engineering and Co-Director Research and Outreach Center (ROC)

  4. University of Pennsylvania, USA

    Gregory S. Rohrer Ph.D.  & David Srolovitz Ph.D. (Member of the National Academy of Engineering, Fellow of MRS, TMS, ASM, Institute of Physics) &  (Member of the National Academy of Engineering, Fellow of MRS, TMS, ASM, Institute of Physics)

  5. Rutgers University, USA

    David Srolovitz Ph.D. (Member of the National Academy of Engineering, Fellow of MRS, TMS, ASM, Institute of Physics) (Member of the National Academy of Engineering, Fellow of MRS, TMS, ASM, Institute of Physics)

  6. Alcoa Technical Center, Pittsburgh, PA, USA

    Hasso Weiland (Technical Fellow) (Technical Fellow)

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© 2016 TMS (The Minerals, Metals & Materials Society)

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Winkelmann, A., Nolze, G., Himmerlich, M., Lebedev, V., Reichmann, A. (2016). Point-Group Sensitive Orientation Mapping Using EBSD. In: Holm, E.A., et al. Proceedings of the 6th International Conference on Recrystallization and Grain Growth (ReX&GG 2016). Springer, Cham. https://doi.org/10.1007/978-3-319-48770-0_41

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