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Three-Dimensional Characterization of Dislocation-Defect Interactions

  • Josh Kacher
  • Grace Liu
  • I M Robertson
Conference paper

Abstract

Transmission electron microscopes play a critical role in building our knowledge base of the atomic structure and composition as well as the electronic and magnetic state of materials. This information is a two-dimensional snapshot of the material state and requires a posteriori analysis to reveal the reaction or processing pathway, or to correlate with a macroscopic property. However, using electron tomography it is feasible to recover the information lost in the electron beam direction and obtain a three-dimensional view of the internal structure in an electron transparent foil. In this paper, example applications of diffraction-contrast electron tomography to understand various dislocation-obstacle interactions are presented and discussed.

Keywords

Dislocations Transmission electron microscopy Electron tomography 

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Copyright information

© TMS (The Minerals, Metals & Materials Society) 2012

Authors and Affiliations

  • Josh Kacher
    • 1
  • Grace Liu
    • 1
  • I M Robertson
    • 1
  1. 1.University of Illinois at Urbana-ChampaignUrbanaUSA

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