Abstract
Transmission electron microscopes play a critical role in building our knowledge base of the atomic structure and composition as well as the electronic and magnetic state of materials. This information is a two-dimensional snapshot of the material state and requires a posteriori analysis to reveal the reaction or processing pathway, or to correlate with a macroscopic property. However, using electron tomography it is feasible to recover the information lost in the electron beam direction and obtain a three-dimensional view of the internal structure in an electron transparent foil. In this paper, example applications of diffraction-contrast electron tomography to understand various dislocation-obstacle interactions are presented and discussed.
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© 2012 TMS (The Minerals, Metals & Materials Society)
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Kacher, J., Liu, G., Robertson, I.M. (2012). Three-Dimensional Characterization of Dislocation-Defect Interactions. In: De Graef, M., Poulsen, H.F., Lewis, A., Simmons, J., Spanos, G. (eds) Proceedings of the 1st International Conference on 3D Materials Science. Springer, Cham. https://doi.org/10.1007/978-3-319-48762-5_32
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DOI: https://doi.org/10.1007/978-3-319-48762-5_32
Publisher Name: Springer, Cham
Print ISBN: 978-3-319-48573-7
Online ISBN: 978-3-319-48762-5
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