Three-Dimensional Characterization of Dislocation-Defect Interactions
Transmission electron microscopes play a critical role in building our knowledge base of the atomic structure and composition as well as the electronic and magnetic state of materials. This information is a two-dimensional snapshot of the material state and requires a posteriori analysis to reveal the reaction or processing pathway, or to correlate with a macroscopic property. However, using electron tomography it is feasible to recover the information lost in the electron beam direction and obtain a three-dimensional view of the internal structure in an electron transparent foil. In this paper, example applications of diffraction-contrast electron tomography to understand various dislocation-obstacle interactions are presented and discussed.
KeywordsDislocations Transmission electron microscopy Electron tomography
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- 1.B.F. McEwen, et al., Principles and Practice in Electron Tomography, in Methods in Cell Biology. 2008, Academic Press. p. 129–168.Google Scholar
- 4.J. Kacher, G.S. Liu, and I.M. Robertson, “In situ and tomographic observations of defect free channel formation in ion irradiated stainless steels,” Micron (2012), DOI: 10.1016/j.micron.2012.01.017Google Scholar
- 10.G.S. Liu, “Time resolved and three-dimensional study of dislocation-particle interactions in aluminum and copper alloys,” Dissertation. 2011, University of Illinois.Google Scholar