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An Automated Multi-Modal Serial Sectioning System for Characterization of Grain-Scale Microstructures in Engineering Materials

  • Michael Uchic
  • Michael Groeber
  • Megna Shah
  • Patrick Callahan
  • Adam Shiveley
  • Michael Scott
  • Michael Chapman
  • Jonathan Spowart

Abstract

This paper describes the development of a new serial sectioning system that has been designed to collect microstructural, crystallographic, and chemical information from volumes in excess of 1 mm3. The system integrates a robotic multi-platen mechanical polishing system with a modern SEM that enables the acquisition of multi-modal data—scanning electron images, EBSD and hyperspectral EDS map—at each section. Selected details of the system construction as well as an initial demonstration of the system capabilities are presented.

Keywords

serial sectioning 3D microscopy EBSD EDS 

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Copyright information

© TMS (The Minerals, Metals & Materials Society) 2012

Authors and Affiliations

  • Michael Uchic
    • 1
  • Michael Groeber
    • 1
  • Megna Shah
    • 2
  • Patrick Callahan
    • 1
    • 3
  • Adam Shiveley
    • 4
  • Michael Scott
    • 2
  • Michael Chapman
    • 4
  • Jonathan Spowart
    • 1
  1. 1.Air Force Research Laboratory, Materials & Manufacturing DirectorateWright-Patterson AFBUSA
  2. 2.UES, IncDaytonUSA
  3. 3.Department of Materials Science and EngineeringCarnegie Mellon UniversityPittsburghUSA
  4. 4.SOCHEDaytonUSA

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