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Advancement of Optical Methods in Experimental Mechanics, Volume 3 pp 61–70Cite as

A New In Situ Planar Biaxial Far-Field High Energy Diffraction Microscopy Experiment

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Abstract

A new experimental platform that combines far-field high-energy diffraction microscopy (HEDM) and in situ planar biaxial loading is presented. The HEDM X-ray diffraction technique, which allows for non-destructive 3D microstructure measurements via serial reconstructions of 2D diffraction patterns, is briefly reviewed. Design attributes of a custom planar biaxial load frame and a new cruciform sample geometry for in situ HEDM experimentation are presented in detail. During the HEDM measurements, this new planar biaxial platform is capable of arbitrary combinations of tension and compression loading for studying full plane stress yield loci while localized gage stresses up to 1.8 GPa are generated with minimal influence from the cruciform geometry stress concentrations. The combination of these experimental capabilities demonstrates an ability to solve a long-standing problem of planar biaxial experimentation on nonlinear materials with unknown constitutive relations: how to measure the gage stress. Finite element results for isotropic elasticity are compared with classical plane stress analysis and digital image correlation (DIC) measurements, and all were found to be in good agreement.

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Abbreviations

δ 11 :

Applied grip displacement in 11 direction

δ 22 :

Applied grip displacement in 22 direction

λ :

δ 11 /δ 22

ε 11s :

FEA simulation gage strain in 11 direction

ε 22s :

FEA simulation gage strain in 22 direction

λ s :

ε 11s /ε 22s

ε 11a :

Analytic formulation gage strain in 11 direction

ε 22a :

Analytic formulation gage strain in 22 direction

λ a :

ε 11a /ε 22a

ν :

Poisson’s ratio

E :

Young’s modulus

ε 11 :

Strain in 11 direction

ε 22 :

Strain in 22 direction

σ 11 :

Stress in 11 direction

σ 22 :

Stress in 22 direction

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Author information

Authors and Affiliations

  1. Mechanical Engineering Department, Colorado School of Mines, Brown Hall W350, 1610 Illinois Street, Golden, CO, 80401, USA

    G. M. Hommer & A. P. Stebner

  2. Materials Physics and Engineering X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, 9700 S. Cass Ave, Building 431-A004, Lemont, IL, 60439, USA

    J. S. Park

  3. Materials Science and Engineering, Iowa State University, 2240 Hoover Hall, 528 Bissell Road, Ames, IA, 50011-1096, USA

    P. C. Collins

  4. Air Force Research Laboratory, Wright-Patterson AFB, Ohio, OH, 45433, USA

    A. L. Pilchak

Authors
  1. G. M. Hommer
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  2. J. S. Park
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  3. P. C. Collins
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  4. A. L. Pilchak
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  5. A. P. Stebner
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Corresponding author

Correspondence to A. P. Stebner .

Editor information

Editors and Affiliations

  1. Department of Chemistry and Physics, Southeastern Louisiana University, Hammond, Louisiana, USA

    Sanichiro Yoshida

  2. Dipartimento di Meccanica, Matematica e Management, Politecnico di Bari, Bari, Italy

    Luciano Lamberti

  3. General Stress Optics, Chicago, Illinois, USA

    Cesar Sciammarella

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Hommer, G.M., Park, J.S., Collins, P.C., Pilchak, A.L., Stebner, A.P. (2017). A New In Situ Planar Biaxial Far-Field High Energy Diffraction Microscopy Experiment. In: Yoshida, S., Lamberti, L., Sciammarella, C. (eds) Advancement of Optical Methods in Experimental Mechanics, Volume 3. Conference Proceedings of the Society for Experimental Mechanics Series. Springer, Cham. https://doi.org/10.1007/978-3-319-41600-7_7

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  • DOI: https://doi.org/10.1007/978-3-319-41600-7_7

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  • Print ISBN: 978-3-319-41599-4

  • Online ISBN: 978-3-319-41600-7

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