Abstract
In this final Chapter, some topics of recent interest in transmission electron microscopy are outlined. Some of these (enviromental TEM, electron tomography, time-resolved microscopy) have been stimulated by recent advances in instrumentation and computer software. Others represent longstanding problems (radiation damage) that have become more urgent or longstanding techniques (electron holography) that are still to be fully exploited.
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© 2016 Springer International Publishing Switzerland
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Egerton, R.F. (2016). Special Topics. In: Physical Principles of Electron Microscopy. Springer, Cham. https://doi.org/10.1007/978-3-319-39877-8_7
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DOI: https://doi.org/10.1007/978-3-319-39877-8_7
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Publisher Name: Springer, Cham
Print ISBN: 978-3-319-39876-1
Online ISBN: 978-3-319-39877-8
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