Abstract
Chapter 5 deals with a kind of electron microscope that offers a slightly inferior resolution compared to the TEM but does not require a thin specimen, and has therefore become a popular tool for research and industrial applications. Examples are presented of the different kinds of image that it can provide.
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© 2016 Springer International Publishing Switzerland
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Egerton, R.F. (2016). The Scanning Electron Microscope. In: Physical Principles of Electron Microscopy. Springer, Cham. https://doi.org/10.1007/978-3-319-39877-8_5
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DOI: https://doi.org/10.1007/978-3-319-39877-8_5
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Publisher Name: Springer, Cham
Print ISBN: 978-3-319-39876-1
Online ISBN: 978-3-319-39877-8
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