Abstract
In this chapter, the effects of the most important sources of error in CS-ADC are analyzed and quantified. These sources of error include devices mismatch, parasitics, comparator offset, and noise. Whenever it is feasible, closed-form expressions are presented. Simulations are employed to validate the expressions.
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References
J.A. Fredenburg, M.P. Flynn, Statistical analysis of ENOB and yield in binary weighted ADCs and DACS with random element mismatch. IEEE Trans. Circuits Syst. Regul. Papers 59 (7), 1396–1408 (2012). doi:10.1109/TCSI.2011.2177006
E. Weisstein, CRC Concise Encyclopedia of Mathematics, 2nd edn. (Taylor & Francis, London, 2002). isbn: 9781420035223
W.P. Zhang, X. Tong, Noise modeling and analysis of SAR ADCs. IEEE Trans. Very Large Scale Integr. Syst. 23 (12), 2922–2930 (2015). doi:10.1109/TVLSI.2014.2379613
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Rabuske, T., Fernandes, J. (2017). Effects of Nonidealities on the Performance of CS-ADCs. In: Charge-Sharing SAR ADCs for Low-Voltage Low-Power Applications . Analog Circuits and Signal Processing. Springer, Cham. https://doi.org/10.1007/978-3-319-39624-8_4
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DOI: https://doi.org/10.1007/978-3-319-39624-8_4
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Publisher Name: Springer, Cham
Print ISBN: 978-3-319-39623-1
Online ISBN: 978-3-319-39624-8
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