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Effects of Nonidealities on the Performance of CS-ADCs

  • Taimur Rabuske
  • Jorge Fernandes
Chapter
  • 1.2k Downloads
Part of the Analog Circuits and Signal Processing book series (ACSP)

Abstract

In this chapter, the effects of the most important sources of error in CS-ADC are analyzed and quantified. These sources of error include devices mismatch, parasitics, comparator offset, and noise. Whenever it is feasible, closed-form expressions are presented. Simulations are employed to validate the expressions.

Keywords

Input Range Transfer Curve Gain Error Behavioral Simulation Capacitor Mismatch 
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References

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    J.A. Fredenburg, M.P. Flynn, Statistical analysis of ENOB and yield in binary weighted ADCs and DACS with random element mismatch. IEEE Trans. Circuits Syst. Regul. Papers 59 (7), 1396–1408 (2012). doi: 10.1109/TCSI.2011.2177006 MathSciNetCrossRefGoogle Scholar
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    E. Weisstein, CRC Concise Encyclopedia of Mathematics, 2nd edn. (Taylor & Francis, London, 2002). isbn: 9781420035223Google Scholar
  3. 3.
    W.P. Zhang, X. Tong, Noise modeling and analysis of SAR ADCs. IEEE Trans. Very Large Scale Integr. Syst. 23 (12), 2922–2930 (2015). doi: 10.1109/TVLSI.2014.2379613 CrossRefGoogle Scholar

Copyright information

© Springer International Publishing Switzerland 2017

Authors and Affiliations

  • Taimur Rabuske
    • 1
  • Jorge Fernandes
    • 1
  1. 1.INESC-ID Instituto Superior TécnicoUniversidade de LisboaLisboaPortugal

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