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Evaluating Memory Efficiency and Robustness of Word Embeddings

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Book cover Advances in Information Retrieval (ECIR 2016)

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Abstract

Skip-Gram word embeddings, estimated from large text corpora, have been shown to improve many NLP tasks through their high-quality features. However, little is known about their robustness against parameter perturbations and about their efficiency in preserving word similarities under memory constraints. In this paper, we investigate three post-processing methods for word embeddings to study their robustness and memory efficiency. We employ a dimensionality-based, a parameter-based and a resolution-based method to obtain parameter-reduced embeddings and we provide a concept that connects the three approaches. We contrast these methods with the relative accuracy loss on six intrinsic evaluation tasks and compare them with regard to the memory efficiency of the reduced embeddings. The evaluation shows that low Bit-resolution embeddings offer great potential for memory savings by alleviating the risk of accuracy loss. The results indicate that post-processed word embeddings could also enhance applications on resource limited devices with valuable word features.

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Notes

  1. 1.

    https://code.google.com/p/word2vec/.

  2. 2.

    https://dumps.wikimedia.org/enwiki/20150112/.

  3. 3.

    https://github.com/ytsvetko/qvec.

  4. 4.

    http://tinyurl.com/jj-ecir2016-eval.

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Acknowledgments

The presented work was developed within the EEXCESS project funded by the European Union Seventh Framework Programme FP7/2007-2013 under grant agreement number 600601.

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Correspondence to Johannes Jurgovsky .

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Jurgovsky, J., Granitzer, M., Seifert, C. (2016). Evaluating Memory Efficiency and Robustness of Word Embeddings. In: Ferro, N., et al. Advances in Information Retrieval. ECIR 2016. Lecture Notes in Computer Science(), vol 9626. Springer, Cham. https://doi.org/10.1007/978-3-319-30671-1_15

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  • DOI: https://doi.org/10.1007/978-3-319-30671-1_15

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-30670-4

  • Online ISBN: 978-3-319-30671-1

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