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Measurement and Noise

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Fundamentals of Nanomechanical Resonators

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Abstract

Max Planck used to say that the only things that exist are those that can be measured. In this chapter a general vision of the issues faced while performing measurements of nanomechanical resonators is presented. Different noise sources are analyzed: thermomechanical noise, electrical noise (Johnson, 1∕f, shot noise), and amplifier noise; to later define the Allan variance and how it relates to frequency noise. This chapter will provide the reader with the necessary information and tools to understand the basics of measurements and to maybe motivate further reading beyond these pages.

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Authors and Affiliations

  1. Vienna University of Technology, Vienna, Austria

    Silvan Schmid

  2. École Polytechnique Fédérale de, Lausanne, Switzerland

    Luis Guillermo Villanueva

  3. California Institute of Technology, Pasadena, CA, USA

    Michael Lee Roukes

Authors
  1. Silvan Schmid
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  2. Luis Guillermo Villanueva
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  3. Michael Lee Roukes
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© 2016 Springer International Publishing Switzerland

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Schmid, S., Villanueva, L.G., Roukes, M.L. (2016). Measurement and Noise. In: Fundamentals of Nanomechanical Resonators. Springer, Cham. https://doi.org/10.1007/978-3-319-28691-4_5

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  • DOI: https://doi.org/10.1007/978-3-319-28691-4_5

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-28689-1

  • Online ISBN: 978-3-319-28691-4

  • eBook Packages: EngineeringEngineering (R0)

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