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References
General References
Van Aert S (2012) Statistical parameter estimation theory – A tool for quantitative electron microscopy. Handbook of Nanoscopy. Wiley VCH, pp 281–309
Van Dyck D (2012) Atomic resolution electron microscopy. Handbook of Nanoscopy. Wiley VCH, pp 45–79
Specific References
Van Aert S, Geuens P, Van Dyck D, Kisielowski C, Jinschek JR (2007) Electron channeling based crystallography. Ultramicroscopy 107:551–558
Van Aert S, Verbeeck J, Erni R, Bals S, Luysberg M, Van Dyck D, Van Tendeloo G (2009) Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy. Ultramicroscopy 109:1236–1244
Van Aert S, Batenburg KJ, Rossell MD, Erni R, Van Tendeloo G (2011) Three-dimensional atomic imaging of crystalline nanoparticles. Nature 470:374–377
Bals S, Van Aert S, Van Tendeloo G, Avila-Brande D (2006) Statistical estimation of atomic positions from exit wave reconstruction with a precision in the picometer range. Phys Rev Lett 96:096106
Coene W, Janssen G, de Op BM, Van Dyck D (1992) Phys Rev Lett 29:37–43
Coene WMJ, Thust A, de Op BM, Van Dyck D (1996) Maximum likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy. Ultramicroscopy 64:109–135
Cowley JM, Moodie AF (1957) The scattering of electrons by atoms and crystals. Acta Cryst 10:609–619
Van Dyck D (1990) Proc. XIIth International Congress for Electron Microscopy (Seattle). San Francisco Press Inc, pp 26–27
Van Dyck D (2002) High-resolution electron microscopy. Adv Imaging Electron Phys 123:105–171
Van Dyck D, Chen JH (1999) A simple theory for dynamical electron diffraction in crystals. Solid State Commun 109:501–505
Van Dyck D, Chen JH (1999) Towards an exit wave in closed analytical form. Acta Crystallographica A 55:212–215
Van Dyck D, Coene W (1987) A new procedure for wave function restoration in high resolution electron microscopy. Optik 77:125–128
Van Dyck D, de Op BM (1996) A simple intuitive theory for electron diffraction. Ultramicroscopy 64:99–107
Van Dyck D, Danckaert J, Coene W, Selderslaghs E, Broddin D, Van Landuyt J, Amelinckx S (1989) The atom column approximation in dynamical electron diffraction calculations. In: Krakow W, O’Keefe M (eds) Computer Simulation of Electron Microscope Diffraction and Images. The Minerals, Metals & Materials Society, Warrendale, pp 107–134
Van Dyck D, de Op BM, Coene W (1993) A new approach to object wavefunction reconstruction in electron microscopy. Optik 93:103–107
Erni R (2010) Aberration corrected imaging in transmission electron microscopy: an introduction. Imperial College Press
Gabor D (1948) A new microscopic principle. Nature 161:777–778
Geuens P, Van Dyck D (2002) The S-state model: a work horse for HRTEM. Ultramicroscopy 93:179–198
Geuens P, Van Dyck D (2005) The S-state model for electron channeling in high-resolution electron microscopy. Adv Imaging Electron Phys 136:111–226
Jia CL, Thust A (1999) Investigation of atomic displacements at a Σ3 {111} twin boundary in BaTiO3 by means of phase-retrieval electron microscopy. Physical Review Letters 82:5052
Jinschek JR, Kisielowski C, Van Dyck D, Geuens P (2004) Measurement of the indium segregation in InGaN based LEDs with single atom sensitivity. In: Ferguson IT, Narendran N, DenBaars SP, Carrano JC (eds) Proceedings of SPIE International Symposium on Optical Science and Technology, vol 5187. SPIE, San Diego, CA, pp 54–63
Kirkland EJ (1984) Improved high resolution image processing of bright field electron micrographs i. theory. Ultramicroscopy 15:151–172
Kisielowski C, Principe E, Freitag B, Hubert D (2001) Benefits of microscopy with super resolution. Physica B308–310:1090–1096
Lichte H (1991) Electron image plane off-axis holography of atomic structures. In: Mulvey T, Sheppard CJR (eds) Adv Optical Electron Microscopy, vol 12. Academic Press, London., pp 25–91
Muller DA (1998) Core level shifts and grain boundary cohesion. In: Bailey GW, Alexander KB, Jerome WG, Bond MG, McCarthy JJ (eds) Microscopy Microanalysis Proc, vol 4(2). Springer, New York., pp 766–767
Muller DA (1999) Why changes in bond lengths and cohesion lead to core level shifts in metals, and consequences for the spatial difference method. Ultramicroscopy 78:163–174
Op de Beeck M, Van Dyck D (1996) Direct structure reconstruction in HRTEM. Ultramicroscopy 64:153–165
de Op BM, Van Dyck D, Coene W (1995) In: Tonomura A (ed) Electron Holography. Elsevier, North Holland, pp 307–316
Pennycook SJ, Jesson DE (1991) High-resolution Z-contrast imaging of crystals. Ultramicroscopy 37:14–38
Rose H (2008) Heat loss of charged particle optics, vol. 153., pp 3–39 (Ed. Hawkes PW)
Rose H (2009) Geometrical charged particle optics. Springer, Berlin
Saxton WO (1978) Computer Techniques for Image Processing. In: Electron Microscopy. Academic Press, New York., pp 236–248 (chapter 9)
Saxton WO (1986) Proc. XIth International Congress on Electron Microscopy. Kyoto
Schiske P (1973) Image processing using additional statistical information about the object. In: Hawkes PW (ed) Image Processing and Computer-aided Design in Electron Optics. Academic Press, London., pp 82–90
Schiske P (1973) Image Processing of Computer-aided Design in Electron Optics (Ed. Hawkes P)
Sinkler W, Marks LD (1999) Dynamical direct methods for everyone. Ultramicroscopy 7:251–268
Thust A, Coene WMJ, Op de Beeck M, Van Dyck D (1996a) Focal-series reconstruction in HRTEM: simulation studies on non-periodic objects. Ultramicroscopy 64:211–230
Thust A, Overwijk MHF, Coene WMJ, Lentzen M (1996b) Numerical correction of lens aberrations in phase-retrieval HRTEM. Ultramicroscopy 64:249–264
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Appendix
Appendix
10.1.1 People
Severin Amelinckx was born on October 30, 1922 and died in Antwerp on February 22, 2007. He was a pioneer in applying TEM to the study of defects in crystals and led a prestigious group in applying not only HRTEM to crystals but particularly in using diffraction geometry to understand contrast in TEM images.
Pierre Delavignette was born on July 3, 1931 and died on December 29, 2011, again in Belgium. He worked closely with his Ph.D. advisor, Professor Amelinckx, throughout his life doing classic work on multi-layer graphene (then known as graphite) and many other layer materials.
10.1.2 Self-Assessment Questions
- Q10.1:
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How do we define the term ‘direct methods ’?
- Q10.2:
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How does the PSF relate to resolution and how does it compare to the ‘impulse-response function’?
- Q10.3:
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What is delocalization in relation to an image? (You may find Chap. 28 of W&C helpful.)
- Q10.4:
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Where did you see channeling in W&C?
- Q10.5:
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How can we have an extinction distance along a single column of atoms?
- Q10.6:
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What is an eigenstate of a Hamiltonian ? (You may need to look back at your physics books.)
- Q10.7:
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What is a ∑ = 5 gb?
- Q10.8:
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Where did you first encounter Argand diagrams?
- Q10.9:
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If we go to all this trouble to obtain pm precision, what is our precision usually in HRTEM?
- Q10.10:
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Express the term ‘goodness of fit’ in a different way that sounds like better grammar and explain why we say ‘goodness of fit’.
- Q10.11:
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We say “invert, or equivalently, undo”. Clarify what we mean by ‘equivalently’.
- Q10.12:
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We say “the difference in averaged atomic number is only 3”. Explain.
- Q10.13:
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So what exactly do we mean by the term ‘statistical parameter estimation theory’?
- Q10.14:
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We want to ‘determine the chemical composition … and count atoms’. Why both?
10.1.3 Text-Specific Questions
- T10.1:
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Discuss the concept of a Wiener filter, using the literature for more details.
- T10.2:
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What do we mean by the term ‘coherent imaging’ and how would we describe this mathematically?
- T10.3:
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Is there any connection between dynamical extinction described here and the extinction distance discussed in Chaps. 15 and 25 of W&C.
- T10.4:
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Elaborate on the use of ‘model-based, structure determination’.
- T10.5:
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Would HAADF STEM or phase-contrast TEM be more affected by channeling?
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Van Dyck, D., Van Aert, S. (2016). Direct Methods for Images Interpretation. In: Carter, C., Williams, D. (eds) Transmission Electron Microscopy. Springer, Cham. https://doi.org/10.1007/978-3-319-26651-0_10
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