Abstract
The theoretical treatment of the spectra of thick substrates and thin films is presented. The theory is built for both normal and oblique incidence phenomena. Emphasis is placed on film characterization aspects. In this connection, the information amount which can be drawn from the interference pattern typical for thin film spectra is discussed in full detail. Selected characterization examples are included, ranging from dielectric thin films to metal layers.
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© 2016 Springer International Publishing Switzerland
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Stenzel, O. (2016). Thick Slabs and Thin Films. In: The Physics of Thin Film Optical Spectra. Springer Series in Surface Sciences, vol 44. Springer, Cham. https://doi.org/10.1007/978-3-319-21602-7_7
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DOI: https://doi.org/10.1007/978-3-319-21602-7_7
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Publisher Name: Springer, Cham
Print ISBN: 978-3-319-21601-0
Online ISBN: 978-3-319-21602-7
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