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Finding the Critical Path with Loop Structure for a Basis Path Testing Using Genetic Algorithm

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Recent Advances in Information and Communication Technology 2015

Part of the book series: Advances in Intelligent Systems and Computing ((AISC,volume 361))

Abstract

Path testing is strongest code coverage in white box testing techniques. The objective of path testing is design path generating of program under test. However, testing all paths does not mean that will find all defects in a program especially loop structure program problem. In this paper significantly achieved used genetic algorithm for automatic finding the critical path. The GA can analyze control flow graphs of program to finding defect path called critical path with loop structure. In addition, the approach designs automation of generating critical paths, which the algorithm can be adopted to find an optimal solution in five programs under test. The experimental results shown that can generate and recommend a set of critical defect path for five programs in different loop structure of program. Our proposed approach is effective to help developer to find critical paths which means the paths should be improved in a program previously.

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Correspondence to Jakkrit Kaewyotha .

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Kaewyotha, J., Songpan (Rungworawut), W. (2015). Finding the Critical Path with Loop Structure for a Basis Path Testing Using Genetic Algorithm. In: Unger, H., Meesad, P., Boonkrong, S. (eds) Recent Advances in Information and Communication Technology 2015. Advances in Intelligent Systems and Computing, vol 361. Springer, Cham. https://doi.org/10.1007/978-3-319-19024-2_5

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  • DOI: https://doi.org/10.1007/978-3-319-19024-2_5

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-19023-5

  • Online ISBN: 978-3-319-19024-2

  • eBook Packages: EngineeringEngineering (R0)

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