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Theoretical Challenges of Simultaneous nc-AFM/STM Experiments

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Imaging and Manipulation of Adsorbates Using Dynamic Force Microscopy

Part of the book series: Advances in Atom and Single Molecule Machines ((AASMM))

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Abstract

The invention of scanning probe microscopy (SPM) provided an unprecedented method to explore locally the material properties of surfaces and nanostructures at the atomic scale. Recent progress, involving the simultaneous acquisition of tunneling current and atomic force measurements, opens new horizons in the SPM field. On the other hand, this enhanced experimental complexity calls for a detailed understanding of the imaging mechanisms. Reliable interpretation of experimental data and further proliferation of this technique strongly relies on our theoretical understanding of ongoing physical processes during scanning. Here, we discuss the current status of, and challenges for, the theoretical description of simultaneous AFM/STM measurements.

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References

  1. Binning, G., Rohrer, H., Gerber, Ch., Weibel, E.: Surface studies by scanning tunneling microscopy. Phys. Rev. Lett. 49, 57–61 (1982)

    Article  CAS  Google Scholar 

  2. Binning, G., Quate, C.F., Gerber, Ch.: Atomic force microscopy. Phys. Rev. Lett. 56–60, 930 (1986)

    Article  Google Scholar 

  3. Lanz, M.A., et al.: Quantitative measurement of short-range chemical bonding forces. Science 291, 2580 (2001)

    Article  Google Scholar 

  4. van der Molen, S.J., Liljeroth, P.: Charge transport through molecular switches. J. Phys. Cond. Matter. 22(13), 133001 (2010)

    Article  Google Scholar 

  5. Chen, C.J.: Introduction to Scanning Tunneling Microscopy. Oxford University Press, Oxford (2008)

    Google Scholar 

  6. Albrecht, T.R., Grütter, P., Horne, D., Rugar, D.: Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivity. J. Appl. Phys. 69, 668 (1991)

    Article  Google Scholar 

  7. Gross, L., Mohn, F., Moll, N., Liljeroth, P., Meyer, G.: The chemical structure of a molecule resolved by atomic force microscopy. Science 325, 1110 (2009)

    Article  CAS  Google Scholar 

  8. Sugimoto, Y., et al.: Chemical identification of individual surface atoms by atomic force microscopy. Nature 446, 64–67 (2007)

    Article  CAS  Google Scholar 

  9. Custance, O., Perez, R., Morita, S.: Atomic force microscopy as a tool for atom manipulation. Nat. Nanotechnol. 4, 803–810 (2009)

    Article  CAS  Google Scholar 

  10. Giessibl, F.J.: High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork. Appl. Phys. Lett. 73, 3956–3958 (1998)

    Article  CAS  Google Scholar 

  11. Giessibl, F.J., Pielmeier, F., Eguchi, T., An, T., Hasegawa, Y.: Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators. Phys. Rev. B 84, 125409 (2011)

    Article  Google Scholar 

  12. Sawada, D., Sugimoto, Y., Morita, K., Abe, M., Morita, S.: Simultaneous measurement of force and tunneling current at room temperature. Appl. Phys. Lett. 94, 173117 (2009)

    Article  Google Scholar 

  13. Loppacher, Ch., Bammerlin, M., Guggisberg, M., Schol, S., Bennewitz, R., Baratoff, A., Meyer, E., Guntherodt, H.-J.: Dynamic force microscopy of copper surfaces-atomic resolution and distance dependence of tip-sample interaction and tunneling current. Phys. Rev. B 62, 16944 (2000)

    Article  CAS  Google Scholar 

  14. Tersoff, J., Hamann, D.R.: Theory and application for the scanning tunneling microscope. Phys. Rev. Lett. 50, 1998–2001 (1983)

    Article  CAS  Google Scholar 

  15. Bardeen, J.: Tunneling from a many-particle point of view. Phys. Rev. Lett. 6(2), 57–59 (1961)

    Article  CAS  Google Scholar 

  16. Chen, C.J.: Tunneling matrix elements in three dimensional space: the derivative rule and the sum rule. Phys. Rev. B 42, 8841–8857 (1990)

    Article  Google Scholar 

  17. Weymouth, A.J., Wutscher, T., Welker, J., Hofmann, T., Giessibl, F.J.: A phantom force induced by the tunneling current, characterized on Si(111). Phys. Rev. Lett. 106, 226801 (2011)

    Article  CAS  Google Scholar 

  18. Majzik, Z., Setvín, M., Bettac, A., Feltz, A., Cháb, V., Jelínek, P.: Simultaneous current, force and dissipation measurements on the Si(111) 7 × 7 surface with an optimized qPlus AFM/STM technique. Beilstein J. Nanotechnol. 3, 249 (2012)

    Article  Google Scholar 

  19. Hofer, W.A., Foster, A.S., Shluger, A.L.: Theories of scanning probe microscopes at the atomic scale. Rev. Mod. Phys. 75, 1287 (2003)

    Article  CAS  Google Scholar 

  20. Sugimoto, Y., Custance, O., Morita, S., Abe, M., Pou, P., Jelinek, P., Pérez, R.: Topographic and force spectroscopic study of the Sn/Si(111)-(√3 × √3)R30º surface using atomic force microscopy. Phys. Rev. B 73, 205329 (2006)

    Article  Google Scholar 

  21. Foster, A.S., Barth, C., Shluger, A.L., Reichling, M.: Unambiguous interpretation of atomically resolved force microscopy images of an insulator. Phys. Rev. Lett. 86, 2373 (2001)

    Article  CAS  Google Scholar 

  22. Lantz, M.A., Hoffmann, R., Foster, A.S., Baratoff, A., Hug, H.J., Hidber, H.R., Güntherodt, H.J.: Site-specific force-distance characteristics on the NaCl(001) surface: measurements versus atomistic simulations. Phys. Rev. B 74, 245426 (2006)

    Article  Google Scholar 

  23. Ternes, M., Gonzalez, C., Lutz, ChP, Hapala, P., Giessibl, F.J., Jelinek, P., Heinrich, A.J.: Interplay of conductance, force and structural change in metallic point contacts. Phys. Rev. Lett. 106, 016802 (2011)

    Article  Google Scholar 

  24. Chiutu, C., Sweetman, A.M., Lakin, A.J., Stannard, A., Jarvis, S., Kantorovich, L., Dunn, J.L., Moriarty, P.: Precise orientation of a single C60 molecule on the tip of a scanning probe microscope. Phys. Rev. Lett. 108, 268302 (2012)

    Article  CAS  Google Scholar 

  25. Guillermet, O., Gauthier, S., Joachim, Ch., de Mendoza, P., Lauterbach, T., Echavarren, A.: STM and AFM high resolution intramolecular imaging of a single decastarphene molecule. Chem. Phys. Lett. 511, 482–485 (2011)

    Article  CAS  Google Scholar 

  26. Pérez, R., Payne, M.C., Stich, I., Terakura, K.: Role of covalent tip-surface interactions in noncontact atomic force microscopy on reactive surfaces. Phys. Rev. Lett. 78, 678–681 (1997)

    Article  Google Scholar 

  27. Yurtsever, A., Sugimoto, Y., Tanaka, H., Abe, M., Morita, S., Ondráček, M., Pou, P., Pérez, R., Jelínek, P.: Force mapping on a partially H-covered Si(111)-(7 × 7) surface: influence of tip and surface reactivity. Phys. Rev. B 87, 155403(1)–155403(10) (2013)

    Article  Google Scholar 

  28. Pou, P., Ghasemi, S.A., Jelinek, P., Lenosky, T., Goedecker, S., Perez, R.: Structure and stability of semiconductor tip apexes for atomic force microscopy. Nanotechnology 20, 264015 (2009)

    Article  CAS  Google Scholar 

  29. Blanco, J.M., Flores, F., Pérez, R.: STM-theory: image potential, chemistry and surface relaxation. Prog. Surf. Sci. 81, 403–443 (2006)

    Article  CAS  Google Scholar 

  30. Caroli, C., Combescot, R., Nozieres, P., Saint-James, D.: Direct calculation of the tunneling current. J. Phys. C 4, 916–929 (1971)

    Article  Google Scholar 

  31. Ondráček, M., Pou, P., Rozsíval, V., González, C., Jelínek, P., Pérez, R.: Forces and currents in carbon nanostructures: are we imaging atoms? Phys. Rev. Lett. 106, 176101 (2011)

    Article  Google Scholar 

  32. Jelínek, P., Ondráček, M., Flores, F.: Relation between the chemical force and the tunnelling current in atomic point contacts: a simple model. J. Phys. Condens. Mat. 24, 084001 (2012)

    Article  Google Scholar 

  33. Blanco, J.M., Gonzalez, C., Jelinek, P., Ortega, J., Flores, F., Perez, R.: First-principles simulations of STM images: from tunneling to the contact regime. Phys. Rev. B 70, 085405 (2004)

    Article  Google Scholar 

  34. Jelinek, P., Svec, M., Pou, P., Perez, R., Chab, V.: Tip-induced reduction of the resonant tunneling current on semiconductor surfaces. Phys. Rev. Lett. 101, 176101 (2008)

    Article  Google Scholar 

  35. Sadewasser, S., Jelinek, P., Fang, C., Custance, O., Yamada, Y., Sugimoto, Y., Abe, M., Morita, S.: New insights on atomic-resolution frequency-modulation Kelvin probe force microscopy imaging on semiconductors. Phys. Rev. Lett. 103, 266103 (2009)

    Article  Google Scholar 

  36. Sugimoto, Y., Ondráček, M., Abe, M., Pou, P., Morita, S., Pérez, R., Flores, F., Jelínek, P.: Quantum degeneracy in atomic point contacts revealed by chemical force and conductance. Phys. Rev. Lett. 111, 106803 (2013)

    Article  Google Scholar 

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Acknowledgments

This work has been supported by the GAČR no. 14-02079S. I would like to acknowledge very fruitful discussion with R. Pérez, P. Pou, F. Flores, M. Ondráček, P. Hapala, Y. Sugimoto, O. Custance, M. Ternes, F.J. Giessibl and many others.

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Authors and Affiliations

  1. Institute of Physics, Academy of Sciences of the Czech Republic, Cukrovarnická 10, 16200, Prague, Czech Republic

    P. Jelínek

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  1. P. Jelínek
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Correspondence to P. Jelínek .

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Editors and Affiliations

  1. School of Physics & Astronomy, University of Nottingham, Nottingham, United Kingdom

    Philip Moriarty

  2. CMES-CNRS, Toulouse, France

    Sebastien Gauthier

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Jelínek, P. (2015). Theoretical Challenges of Simultaneous nc-AFM/STM Experiments. In: Moriarty, P., Gauthier, S. (eds) Imaging and Manipulation of Adsorbates Using Dynamic Force Microscopy. Advances in Atom and Single Molecule Machines. Springer, Cham. https://doi.org/10.1007/978-3-319-17401-3_5

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