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The Application of RFID and Two-Dimensional Bar Code in Substation Inspection

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Cloud Computing (CloudComp 2014)

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Abstract

According to the disadvantages of traditional methods of substation inspection, a new substation inspection system using radio frequency identification and two-dimensional code technology has been developed in this paper. The goals and advantages of substation inspection system which based on radio frequency identification and two-dimensional code technology have been researched. It’s proved that the system willing improve the efficiency and scientific of electricity inspection management.

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Acknowledgments

The work was supported by the National Natural Science Foundation of China (no.61100066).

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Authors and Affiliations

  1. Lab of Parallel Software and Computational Science, Institute of Software Chinese Academy of Sciences, Beijing, China

    DeYi Zou, Ming Cai, Feng Chen, Pan Deng & Huahua Ning

Authors
  1. DeYi Zou
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  2. Ming Cai
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  3. Feng Chen
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  4. Pan Deng
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  5. Huahua Ning
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Corresponding author

Correspondence to DeYi Zou .

Editor information

Editors and Affiliations

  1. Electrical and Computer Engineering, The University of British Columbia, Vancouver, British Columbia, Canada

    Victor C.M. Leung

  2. Cofederal Networks Inc., Renton, Washington, USA

    Roy Xiaorong Lai

  3. School of Computer Science and Technology, Huazhong University of Science and Technology, Wuhan, China

    Min Chen

  4. School of Mechanical and Automotive Engineering, South China University of Technology, Guangzhou, China

    Jiafu Wan

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© 2015 Institute for Computer Sciences, Social Informatics and Telecommunications Engineering

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Zou, D., Cai, M., Chen, F., Deng, P., Ning, H. (2015). The Application of RFID and Two-Dimensional Bar Code in Substation Inspection. In: Leung, V., Lai, R., Chen, M., Wan, J. (eds) Cloud Computing. CloudComp 2014. Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering, vol 142. Springer, Cham. https://doi.org/10.1007/978-3-319-16050-4_20

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  • DOI: https://doi.org/10.1007/978-3-319-16050-4_20

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-16049-8

  • Online ISBN: 978-3-319-16050-4

  • eBook Packages: Computer ScienceComputer Science (R0)

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