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Pruning Ensembles of One-Class Classifiers with X-means Clustering

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Intelligent Information and Database Systems (ACIIDS 2015)

Part of the book series: Lecture Notes in Computer Science ((LNAI,volume 9011))

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Abstract

In this paper, we present a novel approach for pruning ensembles of one-class classifiers. One-class classification is among the most challenging topics in the contemporary machine learning. Creating multiple classifier systems for this task is one of the most effective ways of improving the quality and robustness in case of lack of counterexamples. However, very often we are faced with the problem of redundant or weak classifiers in the pool, as one-class ensembles tend to overproduce the base learners. To tackle this problem a dedicated pruning scheme must be employed, which will allow to discard classifiers that do not contribute to the formed ensemble. We propose to approach this problem as a clustering task. We discover groups of classifiers according to their support function values for the target class. For each group, we select the most representative classifier and discard the remaining ones. We apply an efficient x-means clustering algorithm, that automatically establishes the optimal number of clusters with the use of the Bayesian Information Criterion. Experimental results carried out on a set of benchmarks prove, that our proposed method is able to provide an efficient pruning mechanism for one-class problems.

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References

  1. Alpaydin, E.: Combined 5 x 2 cv f test for comparing supervised classification learning algorithms. Neural Computation 11(8), 1885–1892 (1999)

    Article  Google Scholar 

  2. Cheplygina, V., Tax, D.M.J.: Pruned random subspace method for one-class classifiers. In: Sansone, C., Kittler, J., Roli, F. (eds.) MCS 2011. LNCS, vol. 6713, pp. 96–105. Springer, Heidelberg (2011)

    Chapter  Google Scholar 

  3. Cyganek, B.: One-class support vector ensembles for image segmentation and classification. Journal of Mathematical Imaging and Vision 42(2–3), 103–117 (2012)

    Article  MATH  MathSciNet  Google Scholar 

  4. Demsar, J.: Statistical comparisons of classifiers over multiple data sets. Journal of Machine Learning Research 7, 1–30 (2006)

    MATH  MathSciNet  Google Scholar 

  5. Galar, M., Fernández, A., Barrenechea Tartas, E., Bustince Sola, H., Herrera, F.: Dynamic classifier selection for one-vs-one strategy: Avoiding non-competent classifiers. Pattern Recognition 46(12), 3412–3424 (2013)

    Article  Google Scholar 

  6. García, S., Fernández, A., Luengo, J., Herrera, F.: Advanced nonparametric tests for multiple comparisons in the design of experiments in computational intelligence and data mining: Experimental analysis of power. Inf. Sci. 180(10), 2044–2064 (2010)

    Article  Google Scholar 

  7. Kang, P., Kim, D., Cho, S.: Evaluating the reliability level of virtual metrology results for flexible process control: a novelty detection-based approach. Pattern Analysis and Applications 17(4), 863–881 (2014)

    Article  MathSciNet  Google Scholar 

  8. Krawczyk, B., Woźniak, M.: Combining diverse one-class classifiers. In: Corchado, E., Snášel, V., Abraham, A., Woźniak, M., Graña, M., Cho, S.-B. (eds.) HAIS 2012, Part II. LNCS, vol. 7209, pp. 590–601. Springer, Heidelberg (2012)

    Chapter  Google Scholar 

  9. Krawczyk, B., Woźniak, M.: Diversity measures for one-class classifier ensembles. Neurocomputing 126, 36–44 (2014)

    Article  Google Scholar 

  10. Pelleg, D., Moore, A.W.: X-means: extending k-means with efficient estimation of the number of clusters. In: Proceedings of the Seventeenth International Conference on Machine Learning (ICML 2000), June 29 - July 2, 2000, pp. 727–734. Stanford University, Stanford (2000)

    Google Scholar 

  11. Tax, D.M.J., Duin, R.P.W.: Support vector data description. Machine Learning 54(1), 45–66 (2004)

    Article  MATH  Google Scholar 

  12. Tax, D.M.J., Muller, K.: A consistency-based model selection for one-class classification. In: Proceedings - International Conference on Pattern Recognition, vol. 3, pp. 363–366 (2004). Cited By (since 1996):12

    Google Scholar 

  13. Woźniak, M., Grana, M., Corchado, E.: A survey of multiple classifier systems as hybrid systems. Information Fusion 16(1), 3–17 (2014)

    Article  Google Scholar 

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Correspondence to Michał Woźniak .

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Krawczyk, B., Woźniak, M. (2015). Pruning Ensembles of One-Class Classifiers with X-means Clustering. In: Nguyen, N., Trawiński, B., Kosala, R. (eds) Intelligent Information and Database Systems. ACIIDS 2015. Lecture Notes in Computer Science(), vol 9011. Springer, Cham. https://doi.org/10.1007/978-3-319-15702-3_47

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  • DOI: https://doi.org/10.1007/978-3-319-15702-3_47

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-15701-6

  • Online ISBN: 978-3-319-15702-3

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