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Advanced Instrumentation of Frequency Modulation AFM for Subnanometer-Scale 2D/3D Measurements at Solid-Liquid Interfaces

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Noncontact Atomic Force Microscopy

Part of the book series: NanoScience and Technology ((NANO))

Abstract

Since the first demonstration of true atomic-resolution imaging by frequency modulation atomic force microscopy (FM-AFM) in liquid, the method has been used for imaging subnanometer-scale structures of various materials including minerals, biological systems and other organic molecules. Rencetly, there have been further advancements in the FM-AFM instrumentation. Three-dimensional (3D) force measurement techniques are proposed for visualizing 3D hydration structures formed at a solid-liquid interface. These methods further enabled to visualize 3D distributions of flexible surface structures at interfaces between soft materials and water. Furthermore, the fundamental performance such as force sensitivity and operation speed have been significantly improved using a small cantilever and high-speed phase detector. These technical advancements enabled direct visualization of atomic-scale interfacial phenomena at 1 frame/s. In this chapter, these recent advancements in the FM-AFM instrumentation and their applications to the studies on various interfacial phenomena are presented.

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Acknowledgments

This work was supported by KAKENHI (25706023), Japan Society for the Promotion of Science and ACT-C, Japan Science and Technology Agency.

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Authors and Affiliations

  1. Division of Electrical Engineering and Computer Science, Kanazawa University, Kakuma-machi, Kanazawa, 920-1192, Japan

    Takeshi Fukuma

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  1. Takeshi Fukuma
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Correspondence to Takeshi Fukuma .

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Editors and Affiliations

  1. Institute of Scientific and Industrial Research, Osaka University Nanoscience and Nanotechnology Center, Osaka, Ibaraki, Japan

    Seizo Morita

  2. Institute of Experimental and Applied Physics, University of Regensburg, Regensburg, Germany

    Franz J. Giessibl

  3. Department of Physics, University of Basel, Basel, Switzerland

    Ernst Meyer

  4. ERC Advanced Research Group "FURORE", University of Hamburg, Hamburg, Germany

    Roland Wiesendanger

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Fukuma, T. (2015). Advanced Instrumentation of Frequency Modulation AFM for Subnanometer-Scale 2D/3D Measurements at Solid-Liquid Interfaces. In: Morita, S., Giessibl, F., Meyer, E., Wiesendanger, R. (eds) Noncontact Atomic Force Microscopy. NanoScience and Technology. Springer, Cham. https://doi.org/10.1007/978-3-319-15588-3_20

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