Abstract
This chapter is dedicated to two microscopic techniques which work on the nanometer scale: transmission electron microscopy (TEM) and atomic force microscopy (AFM). Micrographs obtained with these techniques play a pivotal role for several further discussions in this work. In order to gather the information in one place, make it easier to find, and to not interrupt the flow of the remaining text, the general workflows to acquire and process the images and extract the desired data and information from them are explained here. Additionally, the explanations for typical features visible in several unrelated micrographs in the rest of the thesis are given.
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Ebeling, B. (2015). Analysis of microscopic images. In: Smart Nanohybrids of RAFT Polymers and Inorganic Particles. Springer Theses. Springer, Cham. https://doi.org/10.1007/978-3-319-15245-5_4
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DOI: https://doi.org/10.1007/978-3-319-15245-5_4
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