Defects on Bulk MgO(001) Imaged by nc-AFM

Chapter
Part of the Springer Series in Surface Sciences book series (SSSUR, volume 58)

Abstract

In this chapter, noncontact AFM (nc-AFM) work concerning defects on the native MgO(001) surface is reviewed. Due to their relevance Electrostatic force microscopy (EFM) and Kelvin probe force microscopy (KPFM) are first introduced. Experimental spectroscopy curves and images are then discussed and compared with results from theory, with the focus on atomic resolution and defect identification.

Keywords

Atomic Resolution Contact Potential Difference Kelvin Probe Force Microscopy Electrostatic Force Microscopy Frequency Modulation Mode 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Notes

Acknowledgments

The author expresses his very great appreciation to A. L. Shluger, C. R. Henry, A. S. Foster, G. Thornton, O. Pakarinen, M. Watkins, T. Trevethan, K. McKenna, C. Pang, C. Noguera, J. Goniakowski, J. Jupille, G. Pacchioni, U. Heiz, M. Bieletzki, J. Niebauer, A. Ouvrard, B. Bourguignon, Ch. Mottet and M. Reichling for stimulating discussions about MgO in the last years. The author acknowledges the European Science Foundation for financial support through the FANAS project NOMCIS and the French agency for Research (Agence Nationale pour la Recherche, ANR) for financial support through the programs CANA and MISS. Support by the European COST through action D41 and CM1104 is highly acknowledged.

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Copyright information

© Springer International Publishing Switzerland 2015

Authors and Affiliations

  1. 1.Aix-Marseille Université, CNRSMarseille Cedex 09France

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