Abstract
The detection of counterfeit integrated circuits has become a major challenge largely due to the deficiencies in today’s testing mechanisms [1–4]. The detection of such components is still in its infancy, and there are major challenges that must be overcome in order for effective counterfeit detection methods to be deployed. Counterfeiting is an evolving problem with counterfeiters acquiring increasing amounts of experience with each passing day. Hence, it is imperative that we make every effort to stay ahead of them in order to prevent the widespread infiltration of counterfeit parts into our critical infrastructures. By detecting counterfeit parts efficiently, we can also enhance the public’s confidence in the security of systems that surround them. In order to achieve this goal, we must be able to continuously monitor counterfeiting activity and assess counterfeit detection methods in order to evaluate their effectiveness in detecting counterfeit components. We also need to develop a common platform to evaluate the efficacy of a set of test methods.
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Tehranipoor, M.(., Guin, U., Forte, D. (2015). Counterfeit Test Coverage: An Assessment of Current Counterfeit Detection Methods. In: Counterfeit Integrated Circuits. Springer, Cham. https://doi.org/10.1007/978-3-319-11824-6_6
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DOI: https://doi.org/10.1007/978-3-319-11824-6_6
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