Abstract
To prevent the widespread infiltration of counterfeit parts, traceability of electronic components in the supply chain demands more attention. Due to globalization, these components are now manufactured and assembled across the world. Thus, it is necessary to trace the origin of a component to validate the authenticity of its manufacturer.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
SAE, Counterfeit electronic parts; avoidance, detection, mitigation, and disposition, 2009, http://standards.sae.org/as5553/
U. Guin, D. DiMase, M. Tehranipoor, Counterfeit integrated circuits: Detection, avoidance, and the challenges ahead.,” J. Electron. Test. 30(1), 9–23 (2014)
U. Guin, D. Forte, M. Tehranipoor, Anti-counterfeit techniques: from design to resign, in Microprocessor Test and Verification (MTV), 2013
Departnent of Defense, Performance Specification: Hybrid Microcircuits, General Specification For, 2009, http://www.dscc.dla.mil/Downloads/MilSpec/Docs/MIL-PRF-38534/prf38534.pdf
K. Arndt, C. Narayan, A. Brintzinger, W. Guthrie, D. Lachtrupp, J. Mauger, D. Glimmer, S. Lawn, B. Dinkel, A. Mitwalsky, Reliability of laser activated metal fuses in drams, in Proc. of IEEE on Electronics Manufacturing Technology Symposium, 1999, pp. 389–394
N. Robson, J. Safran, C. Kothandaraman, A. Cestero, X. Chen, R. Rajeevakumar, A. Leslie, D. Moy, T. Kirihata, S. Iyer, Electrically programmable fuse (efuse): From memory redundancy to autonomic chips, in CICC, 2007, pp. 799–804
B. Gassend, D. Clarke, M. Van Dijk, S. Devadas, Silicon physical random functions, in Proc. CCS (ACM, 2002), pp. 148–160
G. Suh, S. Devadas, Physical Unclonable Functions for device authentication and secret key generation, in Proc. DAC, 2007, pp. 9–14
J. Guajardo, S. Kumar, G. Schrijen, P. Tuyls, FPGA intrinsic PUFs and their use for IP protection, in Proc. CHES, 2007, pp. 63–80
R. Maes, I. Verbauwhede, Physically Unclonable Functions: A study on the state of the art and future research directions. Towards Hardware Intrinsic Secur., pp. 3–37, 2010
M. Rahman, D. Forte, J. Fahrny, M. Tehranipoor, Aro-puf: An aging-resistant ring oscillator puf design, in Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014, March 2014, pp. 1–6
S. Morozov, A. Maiti, P. Schaumont, An analysis of delay based puf implementations on fpga. Reconfig. Comput. Architect. Tools Appl. 382–387 (2010)
M. Alam, S. Mahapatra, A comprehensive model of pmos nbti degradation. Microelectron. Reliab. 45(1), 71–81 (2005)
S. Bhardwaj, W. Wang, R. Vattikonda, Y. Cao, S. Vrudhula, Predictive modeling of the nbti effect for reliable design, in Proc. of IEEE on Custom Integrated Circuits Conference, September 2006, pp. 189–192
K.-L. Chen, S. Saller, I. Groves, D. Scott, Reliability effects on mos transistors due to hot-carrier injection. IEEE Trans. Electron Dev. 32(2), 386–393 (1985)
S. Mahapatra, D. Saha, D. Varghese, P. Kumar, On the generation and recovery of interface traps in mosfets subjected to nbti, fn, and hci stress. IEEE Trans. Electron Dev. 53(7), 1583–1592 (2006)
I. Verbauwhede, R. Maes, Physically unclonable functions: manufacturing variability as an unclonable device identifier, in Proc. GLSVLSI (ACM, 2011), pp. 455–460
A. Maiti, P. Schaumont, Improved ring oscillator puf: An fpga-friendly secure primitive. J. Cryptology, 1–23 (2011)
S. Katzenbeisser, Ü. Kocabaş, V. Rožić, A. Sadeghi, I. Verbauwhede, C. Wachsmann, PUFs: Myth, fact or busted? A security evaluation of Physically Unclonable Functions (PUFs) cast in silicon. Proc. CHES, 283–301 (2012)
D. Lim, J. Lee, B. Gassend, G. Suh, M. van Dijk, S. Devadas, Extracting secret keys from integrated circuits. IEEE Trans. Very Large Scale Integration (VLSI) Syst. 13(10), 1200–1205 (2005)
K. Xiao, M. Rahman, D. Forte, Y. Huang, M. Su, M. Tehranipoor, Bit selection algorithm suitable for high-volume production of sram-puf, in 2014 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST), May 2014, pp. 101–106
A. Maiti, P. Schaumont, Improved ring oscillator puf: An fpga-friendly secure primitive. J. Cryptology 24(2), 375–397 (2011)
D. Wave, Answer to your questions about the QR Code, http://www.qrcode.com/en/
ISO/IEC 18004:2006, Information technology - Automatic identification and data capture techniques - QR Code 2005 bar code symbology specification, (2006) http://www.iso.org/iso/catalogue_detail?csnumber=43655
E. Ohbuchi, H. Hanaizumi, L. Hock, Barcode readers using the camera device in mobile phones, in 2004 International Conference on Cyberworlds, Nov 2004, pp. 260–265
D. Wave, QR Code Essentials. [Online]. Available: http://www.nacs.org/LinkClick.aspx?fileticket=D1FpVAvvJuo%3D&tabid=1426&mid=4802
A. Markman, B. Javidi, M. Tehranipoor, Photon-counting security tagging and verification using optically encoded qr codes. Photonics J. IEEE 6(1), 1–9 (2014)
E. Pérez-Cabré, H.C. Abril, M.S. Millán, B. Javidi, Photon-counting double-random-phase encoding for secure image verification and retrieval. J. Optics 14(9), 094001 (2012). [Online]. Available: http://stacks.iop.org/2040-8986/14/i=9/a=094001
D. Huffman, A method for the construction of minimum-redundancy codes. Proc. IRE 40(9), 1098–1101 (1952)
Signature DNA, http://www.adnas.com/products/signaturedna
U.S. Defense Logistics Agency, Dna authentication marking on items in fsc 5962, August 2012. [Online]. Available: https://www.dibbs.bsm.dla.mil/notices/msgdspl.aspx?msgid=685
J.A. Hayward, J. Meraglia, DNA Marking and Authentication: A unique, secure anti-counterfeiting program for the electronics industry, Oct. 2011
Applied DNA CPA Program, http://www.adnas.com/CPA
C. Kuemin, L. Nowack, L. Bozano, N.D. Spencer, H. Wolf, Oriented assembly of gold nanorods on the single-particle level. Adv. Funct. Mater. 22(4), 702–708 (2012)
IBM Research, Nanorods take down counterfeiters: IBM scientists create nano-sized patterns to thwart forgeries, http://www.research.ibm.com/articles/nano-counterfeit.shtml
B. Skoric, S. Maubach, T. Kevenaar, P. Tuyls, Information-theoretic analysis of capacitive physical unclonable functions. J. Appl. Phys. 100(2), 024902 (2006)
Semiconductor Industry Association (SIA), Public Comments - DNA Authentication Marking on Items in FSC5962, Nov 2012
Author information
Authors and Affiliations
Rights and permissions
Copyright information
© 2015 Springer International Publishing Switzerland
About this chapter
Cite this chapter
Tehranipoor, M.(., Guin, U., Forte, D. (2015). Chip ID. In: Counterfeit Integrated Circuits. Springer, Cham. https://doi.org/10.1007/978-3-319-11824-6_12
Download citation
DOI: https://doi.org/10.1007/978-3-319-11824-6_12
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-319-11823-9
Online ISBN: 978-3-319-11824-6
eBook Packages: EngineeringEngineering (R0)