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Tailoring of Magnetic Properties and GMI Effect of Amorphous Microwires by Annealing

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Sensing Technology: Current Status and Future Trends III

Part of the book series: Smart Sensors, Measurement and Instrumentation ((SSMI,volume 11))

Abstract

We studied Giant magnetoimpedance (GMI) effect and magnetic properties of amorphous Fe-Co rich as-prepared and annealed microwires. We measured the GMI magnetic field and frequency dependences, hysteresis loops and domain walls (DWs) dynamics of composite microwires produced by the Taylor-Ulitovski technique. We observed that these properties can be tailored either controlling magnetoelastic anisotropy of as-prepared CoFeBSiC microwires or controlling their magnetic anisotropy by heat treatment. High GMI effect has been observed in as-prepared Co-rich microwires. High DW velocity and rectangular hysteresis loops we observed in heat treated Co-rich microwires. We observe increasing of the DW velocity under stress in some annealed samples. At certain annealing conditions we observed coexistence of GMI effect and fast DW propagation in the same annealed sample.

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Authors and Affiliations

  1. Department of Material Physics, Basque Country University, UPV/EHU, 20018, San Sebastian, Spain

    A. Zhukov, M. Ipatov, A. Talaat & V. Zhukova

  2. Basque Foundation for Science, IKERBASQUE, 48011, Bilbao, Spain

    A. Zhukov

  3. Department of Applied Physics, EUPDS, Basque Country University, UPV/EHU, 20018, San Sebastian, Spain

    J. M. Blanco

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  1. A. Zhukov
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  2. M. Ipatov
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  1. Liverpool John Moores University, Liverpool, United Kingdom

    Alex Mason

  2. Massey University (Manawatu), Palmerston North, New Zealand

    Subhas Chandra Mukhopadhyay

  3. Massey University (Manawatu Campus), Palmerston North, New Zealand

    Krishanthi Padmarani Jayasundera

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Zhukov, A., Ipatov, M., Talaat, A., Blanco, J.M., Zhukova, V. (2015). Tailoring of Magnetic Properties and GMI Effect of Amorphous Microwires by Annealing. In: Mason, A., Mukhopadhyay, S., Jayasundera, K. (eds) Sensing Technology: Current Status and Future Trends III. Smart Sensors, Measurement and Instrumentation, vol 11. Springer, Cham. https://doi.org/10.1007/978-3-319-10948-0_20

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  • DOI: https://doi.org/10.1007/978-3-319-10948-0_20

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